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Scanning tunneling microscopy observation of surface reconstruction of GaN on sapphire and 6H-SiC

机译:蓝宝石和6H-SiC表面GaN表面重建的扫描隧道显微镜观察

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摘要

We report studies of the surface structure of MBE-grown GaN layers on sapphire (0001) and 6H-(0001) SiC substrates. A different set of reconstructions is observed for nitrogen-face and gallium-face layers. The gallium-face has so far only been grown on MOCVD GaN/ sapphire substrates, while the nitrogen-face has been obtained on SiC and bare sapphire substrates.
机译:我们报告了在蓝宝石(0001)和6H-(0001)SiC衬底上MBE生长的GaN层的表面结构的研究。对于氮面层和镓面层,观察到一组不同的重构。到目前为止,镓面仅在MOCVD GaN /蓝宝石衬底上生长,而氮面在SiC和裸蓝宝石衬底上获得。

著录项

  • 来源
    《Nitride semiconductors》|1997年|363-368|共6页
  • 会议地点 Boston MA(US)
  • 作者单位

    Department of Physics, Carnegie Mellon University, Pittsburgh, PA 15213;

    Department of Physics, Carnegie Mellon University, Pittsburgh, PA 15213;

    Department of Physics, Carnegie Mellon University, Pittsburgh, PA 15213;

    Department of Electrical and Computer Engineering, Carnegie Mellon University;

    Fritz-Haber Institut der Max-Planck-Gesellschaft, Faradayweg 4-6, D14195 Berlin, Germany;

    Xerox Palo Alto Research Center, 3333 Coyote Hill Road, Palo Alto, CA 94304;

    Department of Materials Science, Carnegie Mellon University;

    Department of Materials Science, Carnegie Mellon University;

  • 会议组织
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 材料;
  • 关键词

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