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首页> 外文会议>Nuclear radiation detection materials-2011 >Characterization of Pd Impurities and Finite-Sized Defects in Detector Grade CdZnTe
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Characterization of Pd Impurities and Finite-Sized Defects in Detector Grade CdZnTe

机译：检测器级CdZnTe中Pd杂质和有限缺陷的表征

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摘要

Synthetic CdZnTe or "CZT" crystals are highly suitable for γ-spectrometers operating at the room temperature. Secondary phases (SP) in CZT are known to inhibit detector performance, particularly when they are present in large numbers or dimensions. These SP may exist as voids or composites of non-cubic phase metallic Te layers with bodies of polycrystalline and amorphous CZT material and voids. Defects associated with crystal twining may also influence detector performance in CZT. Using transmission electron microscopy, we identify two types of defects that are on the nano scale. The first defect consists of 40 nm diameter metallic Pd/Te bodies on the grain boundaries of Te-rich composites. Although the nano-Pd/Te bodies around these composites may be unique to the growth source of this CZT material, noble metal impurities like these may contribute to SP formation in CZT. The second defect type consists of atom-scale grain boundary dislocations. Specifically, these involve inclined "finite-sized" planar defects or interfaces between layers of atoms that are associated with twins. Finite-sized twins may be responsible for the subtle but observable striations that can be seen with optical birefringence imaging and synchrotron X-ray topographic imaging.
机译：合成的CdZnTe或“ CZT”晶体非常适合在室温下运行的γ光谱仪。众所周知，CZT中的次级相（SP）会抑制检测器性能，尤其是当它们以大量或大尺寸存在时。这些SP可以作为空隙或非立方相金属Te层与多晶和非晶CZT材料和空隙的复合体存在。与晶体缠绕有关的缺陷也可能影响CZT中的检测器性能。使用透射电子显微镜，我们可以识别出纳米级的两种类型的缺陷。第一个缺陷由富Te复合材料晶界上直径为40 nm的金属Pd / Te体组成。尽管这些复合材料周围的纳米Pd / Te体可能是这种CZT材料的生长源所独有的，但像这样的贵金属杂质可能有助于CZT中SP的形成。第二种缺陷类型由原子级晶界位错组成。具体而言，这些涉及倾斜的“有限尺寸”平面缺陷或与孪晶相关的原子层之间的界面。有限尺寸的双胞胎可能是造成细微但可观察到的条纹的原因，这些条纹可以通过光学双折射成像和同步加速器X射线形貌成像观察到。

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  • 来源
  • 会议地点 San Francisco CA(US);San Francisco CA(US)
  • 作者

    M.C. Duff; J.P. Bradley; Z.R. Dai; N. Teslich; A. Burger; M. Groza; V. Buliga;

  • 作者单位

    Savannah River National Laboratory, Aiken, SC 29808, U.S.A.;

    Lawrence Livermore National Laboratory, Livermore, CA 94550, U.S.A.;

    Lawrence Livermore National Laboratory, Livermore, CA 94550, U.S.A.;

    Lawrence Livermore National Laboratory, Livermore, CA 94550, U.S.A.;

    Fisk University, Nashville, TN 37208, U.S.A.;

    Fisk University, Nashville, TN 37208, U.S.A.;

    Fisk University, Nashville, TN 37208, U.S.A.;

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  • 正文语种 eng
  • 中图分类 功能材料;
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