Direct in situ GDD measurement in optical coating process

机译：光学镀膜过程中的直接原位GDD测量

获取原文

获取原文并翻译 | 示例

页面导航

摘要
著录项
相似文献
相关主题

摘要

In the presented work a fast frequency domain measurement system to determine group delay (GD) and group delay dispersion (GDD) of optical coatings is proposed. The measurements are performed in situ directly on moving substrates during the thin film coating process. The method is based on a Michelson interferometer, which is equipped with a high power broad band light source and a fast spectrometer. Especially for the production of chirped mirrors it is advantageous to obtain group delay and group delay dispersion data of the last layers. This additional information allows for online corrections of coating errors to enhance the precision of complex interference filters for short pulse applications.

机译：在提出的工作中，提出了一种用于确定光学涂层的群时延（GD）和群时延色散（GDD）的快速频域测量系统。测量是在薄膜涂覆过程中直接在移动的基板上进行的。该方法基于迈克尔逊干涉仪，该干涉仪配备有高功率宽带光源和快速光谱仪。特别是对于of反射镜的生产，获得最后层的群时延和群时延色散数据是有利的。此附加信息允许在线校正涂层错误，以增强短脉冲应用中复杂干涉滤光片的精度。

著录项

来源
《Optical Systems Design 2015: Advances in optical thin films V》|2015年|96271S.1-96271S.9|共9页
会议地点 Jena(DE)
作者
S. Schlichting; T. Willemsen; H. Ehlers; U. Morgner; D. Ristau;
展开▼
作者单位

Laser Zentrum Hannover e.V., Hollerithallee 8, 30419 Hanover, Germany;

Laser Zentrum Hannover e.V., Hollerithallee 8, 30419 Hanover, Germany;

Laser Zentrum Hannover e.V., Hollerithallee 8, 30419 Hanover, Germany;

Institut fuer Quantenoptik, Leibniz Universitaet Hannover, Welfengarten 1, 30167 Hanover, Germany;

Laser Zentrum Hannover e.V., Hollerithallee 8, 30419 Hanover, Germany;

展开▼
会议组织
原文格式 PDF
正文语种 eng
中图分类
关键词
in situ measurement; GD; GDD; FTSI; STFT; optical coatings; optical thin films; chirped mirrors;

机译：原位测量GD; GDD； FTSI； STFT;光学涂料；光学薄膜rp镜子;

相似文献

外文文献
中文文献
专利

1. Phase Transition Studies on Solution-Processed Vanadium Dioxide Coatings Through Optical Measurements [J] . S. S. Shaiju, Swastik Nath, Biswapriya Deb Journal of materials science . 2021,第2期

机译：通过光学测量溶液加工钒二氧化钒涂层的相转变研究
2. Determination of the optical constants of a dielectric layer by processing in situ spectral transmittance measurements along the time dimension [J] . Lequime Michel, Nadji Severin L., Stojcevski Dragan, Applied optics . 2017,第4期

机译：沿着时间尺寸的原位谱透射率测量法测定介电层的光学常数
3. Comparison of coating stresses produced by high velocity liquid/gas fuel and triplex pro 200 plasma processes using in-situ coating stress measurement [J] . R. Molz, A. Valarezo, S. Sampath DVS-Berichte . 2008,第252期

机译：使用原位涂层应力测量比较高速液体/气体燃料和Triplex pro 200等离子工艺产生的涂层应力
4. Direct in situ GDD measurement in optical coating process [C] . S. Schlichting, T. Willemsen, H. Ehlers, Conference on Optical Systems Design 2015: Advances in optical thin films V . 2015

机译：直接原位GDD测量在光学涂层过程中
5. In-situ monitoring of undercoating corrosion damage by Direct Optical Interrogation (DOI) [D] . Lopez-Garrity, Meng 2013

机译：通过直接光学询问（DOI）现场监测底涂层腐蚀损坏
6. Processing and Characterization of Nanoparticle Coatings for Quartz Crystal Microbalance Measurements [O] . Jessica D. Torrey, Teresa L. Kirschling, Lauren F. Greenlee 2015

机译：用于石英晶体微天平测量的纳米颗粒涂层的加工和表征
7. Direct in situ GDD measurement in optical coating process [O] . Schlichting S., Willemsen Thomas, Ehlers H., 2015

机译：光学镀膜过程中的直接原位GDD测量

Direct in situ GDD measurement in optical coating process

摘要

著录项

相似文献

相关主题

期刊订阅