Measuring Silicon Pore Optics

著录项

• 来源
  《Optics for EUV, x-ray, and gamma-ray astronomy VIII》|2017年|103990N.1-103990N.6|共6页
• 会议地点 San Diego(US)
• 作者

  Giuseppe Vacanti; Nicolas Barriere; Marcos Bavdaz; Abdelhakim Chatbi; Maximilien Collon; Danieelle Dekker; David Girou; Ramses Guenther; Roy van der Hoeven; Michael Krumrey; Boris Landgraf; Peter Mueller; Swenja Schreiber; Mark Vervest; Eric Wille;

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• 作者单位

  cosine Science Computing BV, Oosteinde 36, 2361 HE, Warmond , The Netherlands;

  cosine Science Computing BV, Oosteinde 36, 2361 HE, Warmond , The Netherlands;

  European Space Agency, Keplerlaan 1, PO Box 299, 2200 AG Noordwijk, The Netherlands;

  cosine Science Computing BV, Oosteinde 36, 2361 HE, Warmond , The Netherlands;

  cosine Research BV, Oosteinde 36, 2361 HE, Warmond, The Netherlands;

  cosine Science Computing BV, Oosteinde 36, 2361 HE, Warmond , The Netherlands;

  cosine Science Computing BV, Oosteinde 36, 2361 HE, Warmond , The Netherlands;

  cosine Science Computing BV, Oosteinde 36, 2361 HE, Warmond , The Netherlands;

  cosine Science Computing BV, Oosteinde 36, 2361 HE, Warmond , The Netherlands;

  Physikalisch-Technische Bundesanstalt (PTB), Abbestr. 2-12, 10587 Berlin, Germany;

  cosine Science Computing BV, Oosteinde 36, 2361 HE, Warmond , The Netherlands;

  Physikalisch-Technische Bundesanstalt (PTB), Abbestr. 2-12, 10587 Berlin, Germany;

  Physikalisch-Technische Bundesanstalt (PTB), Abbestr. 2-12, 10587 Berlin, Germany;

  cosine Science Computing BV, Oosteinde 36, 2361 HE, Warmond , The Netherlands;

  European Space Agency, Keplerlaan 1, PO Box 299, 2200 AG Noordwijk, The Netherlands;

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• 会议组织
• 原文格式 PDF
• 正文语种 eng
• 中图分类
• 关键词

  X-ray optics; X-ray astronomy; Silcon Pore Optics; X-ray telescopes; X-ray testing; ray tracing;

  机译：X射线光学； X射线天文学； Silcon孔光学； X射线望远镜； X射线测试；光线追踪;