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Shot Number Estimation for EB Direct Writing for Logic LSI Utilizing Character-Build Standard-Cell Layout Technique

机译:利用字符构建标准单元布局技术的逻辑LSI EB直接写入的镜头数量估计

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Electron Beam direct writing (EBDW) technology is the most cost-effective lithography tool for small-volume logic-LSI fabrication. The EB exposure time will be greatly reduced by applying character-projection (CP) aperture. But the applicable number of CP aperture is limited to 25-400 depending upon EB lithography apparatus. The cell-based logic LSIs are composed of standard-cells (SCs) whose number is 400-1000. Therefore, it is impossible to implement all SCs as CP apertures, because the SCs are placed to 4-directions in general. We had proposed the new technique named "Character-Build (CB) standard-cell", and demonstrate the most of the combination-logic SCs can be composed by only 17 CP apertures. In this paper, not only combination-logic SCs but also sequential-logic SCs are considered. The number of EB-shots and the chip-area are estimated for some sample circuits. Compared to the simply-limited SCs, The EB shot number is 30-40% reduced by using proposed CB standard-cell, when the CP aperture numbers are 20-30. Moreover, CB standard-cell was advantageous in the module area. Considering 2-directional placement of SCs, the combination of the EB apparatus with 50-100 CP apertures and the CB standard-cell technique may be the best method for high-speed EB direct-writing.
机译:电子束直接写入(EBDW)技术是用于小批量逻辑LSI制造的最具成本效益的光刻工具。通过使用字符投影(CP)光圈,EB曝光时间将大大减少。但是,取决于EB光刻设备,CP孔径的适用数量限制为25-400。基于单元的逻辑LSI由数量为400-1000的标准单元(SC)组成。因此,不可能将所有的SC都实现为CP孔,因为SC通常是沿4方向放置的。我们提出了一种名为“字符构建(CB)标准单元”的新技术,并演示了大多数组合逻辑SC只能由17个CP孔径组成。在本文中,不仅考虑了组合逻辑SC,而且考虑了顺序逻辑SC。对于某些示例电路,估计了EB射出的数量和芯片区域。与简单限制的SC相比,当CP光圈数为20-30时,使用建议的CB标准单元可以将EB拍摄数量减少30-40%。而且,CB标准单元在模块区域是有利的。考虑到SC的2方向放置,具有50-100 CP孔径的EB设备和CB标准单元技术的结合可能是高速EB直接写入的最佳方法。

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