Institute of Electronic Materials and Devices, Leibniz University, Schneiderberg 32, D- 30167 Hannover, Germany;
Institute for Solar Energy Systems, State Key Laboratory of Optoelectronic Materials and Technologies, Sun Yat-sen University, Guangzhou 510006, China;
Institute of Electronic Materials and Devices, Leibniz University, Schneiderberg 32, D- 30167 Hannover, Germany,School of Electronics Engineering Vellore Institute of Technology (VIT) Vellore, Tamil Nadu, India;
Information Technology Laboratory, Leibniz University, Schneiderberg 32, D-30167 Hannover, Germany;
Institute of Electronic Materials and Devices, Leibniz University, Schneiderberg 32, D- 30167 Hannover, Germany;
机译:碳掺入外延Gd_2O_3薄膜对硅的影响:电学性质的实验研究
机译:界面层组成对高K应用外延Gd_2O_3薄膜电学性能的影响
机译:Si上掺氮外延Gd_2O_3薄膜的带隙和直流泄漏特性研究
机译:Si基材上的碳掺杂外延Gd_2O_3薄膜的增强电性能
机译:改进IV族光子图:研究外延生长,低温硅和掺杂硅薄膜的材料特性
机译:超声喷雾热解法形成铟掺杂氧化锌薄膜的研究:气溶胶溶液中水分的含量和基质温度对提高电迁移的重要性
机译:(100)和(111)取向SrTiO3衬底上外延掺Hf的Bi4Ti3O12薄膜的各向异性电学性能
机译:衬底对金属有机化学气相沉积制备的外延pbTiO(sub 3)薄膜的结构和光学性质的影响