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首页> 外文会议>Precision control for advanced manufacturing systems >Design of a Functional Testing System for Cycle-to-Cycle Process Control of Hot Embossed Microfluidic Devices
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Design of a Functional Testing System for Cycle-to-Cycle Process Control of Hot Embossed Microfluidic Devices

机译：热压纹微流控设备的逐周期过程控制功能测试系统的设计

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摘要

A functional testing system was developed to inspect and test microfluidic chips produced from a hot micro-embossing machine. The system uses 2 off-the-shelf microscope cameras and optics systems to inspect chips that have been sealed with adhesive tape. With one camera, it can evaluate the quality of channel formation in the chips by measuring the outer channel widths. With the other camera, it can evaluate the variability between how well the chips function. Both of these tests only require a single image each, making it possible for the machine to be run in-line with the embossing machine for cycle-to-cycle closed-loop feedback control in real time. This will allow the process to optimize channel quality and be robust to disturbances (ie. material or environmental changes).
机译：开发了功能测试系统以检查和测试由热微压花机生产的微流体芯片。该系统使用2台现成的显微镜照相机和光学系统检查用胶带密封的芯片。使用一台摄像机，它可以通过测量外部通道宽度来评估芯片中通道形成的质量。使用另一台摄像机，它可以评估芯片功能之间的差异。这两个测试每个都只需要一个图像，这使得该机器可以与压花机串联运行，以实时进行逐周期闭环反馈控制。这将允许该过程优化信道质量，并且对干扰（例如，材料或环境变化）具有鲁棒性。

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  • 会议地点 Cambridge MA(US)
  • 作者

    Caitlin Reyda; David Hardt;

  • 作者单位

    Department of Mechanical Engineering, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139;

    Department of Mechanical Engineering, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139;

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  • 正文语种 eng
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