SCANNING WHITE LIGHT INTERFEROMETRY FOR USE IN CHARACTERIZING BIOMIMETIC IMPLANT COATINGS

机译：扫描白光干涉法用于表征生物假体涂层

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SWLI is an excellent surface analysis technique for characterizing biomimetic DOPS implant coatings. Use of SWLI to capture surface morphology and roughness information of these implant coatings is uniquely beneficial in several ways. First, it allows non-destructive measurement of the coatings. Unlike SEM, which requires a conductive gold (or similar) coating on the surface and decreased atmospheric pressure for imaging, SWLI can be used to measure these coatings before or after other testing is performed.

机译：SWLI是用于表征仿生DOPS植入物涂层的出色表面分析技术。使用SWLI捕获这些植入物涂层的表面形态和粗糙度信息在几种方面具有独特优势。首先，它可以对涂层进行无损测量。与SEM不同，SEM需要在表面进行导电金（或类似材料）涂层，并降低大气压力以进行成像，而SWLI可以在执行其他测试之前或之后用于测量这些涂层。

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来源
《Proceedings of the Twenty-sixth annual meeting of the American Society for Precision Engineering》|2011年|p.543-546|共4页
会议地点 Denver CO(US);Denver CO(US)
作者
William P. Rodgers III; Jack Clark; David A. Prawel; Susan P. James;
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作者单位

School of Biomedical Engineering Colorado State University Fort Collins, Colorado, USA;

Department of Mechanical Engineering Colorado State University Fort Collins, Colorado, USA;

School of Biomedical Engineering Colorado State University Fort Collins, Colorado, USA;

School of Biomedical Engineering Colorado State University Fort Collins, Colorado, USA,Department of Mechanical Engineering Colorado State University Fort Collins, Colorado, USA;

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原文格式 PDF
正文语种 eng
中图分类机械加工精度理论;
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SCANNING WHITE LIGHT INTERFEROMETRY FOR USE IN CHARACTERIZING BIOMIMETIC IMPLANT COATINGS

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