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CONTROLLED DEPOSITION OF WEDGE-SHAPED THICKNESS PROFILES BY PULSED LASER DEPOSITION

机译:脉冲激光沉积可控制楔形厚度轮廓的沉积

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摘要

A method yielding precisely controlled thickness profiles in thin-film growth is necessary for continuous compositional spread techniques. While multiple approaches have been introduced and successfully tested, some specific applications require the use of very thin "wedge"-type profiles (~10 A at the thickest point), while at the same time yielding lateral sample sizes of several centimeters. Here we introduce the basic principles of a pulsed-laser deposition based approach utilizing the translation of the substrate behind a slit-shaped aperture and demonstrate that this method can satisfy these requirements.
机译:对于连续的成分扩散技术来说,在薄膜生长中产生精确控制厚度轮廓的方法是必需的。尽管已经引入了多种方法并成功进行了测试,但某些特定应用要求使用非常薄的“楔形”型轮廓(最厚点约为10 A),同时产生的横向样品尺寸为几厘米。在这里,我们介绍了一种利用脉冲激光沉积方法的基本原理,该方法利用了缝隙形孔后面的基板平移,并证明了该方法可以满足这些要求。

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