【24h】

In_(0.3)Ga_(0.7)As PLATE CRYSTAL GROWTH FOR SUBSTRATES BY THE TLZ METHOD

机译:TLZ法测定In_(0.3)Ga_(0.7)As基片的晶体生长

获取原文
获取原文并翻译 | 示例

摘要

We have succeeded in growing plate shaped In_(0.3)Ga_(0.7)As single crystals for substrate use by the traveling liquidus zone (TLZ) method. The TLZ method which we have invented for growing homogeneous mixed crystals requires diffusion-limited mass transport and convection in a melt should be avoided. In that point, large diameter crystals for substrates were difficult to be grown due to convection. Therefore, we attempted to grow plate shaped In_(0.3)Ga_(0.7)As crystals. Merits of plate crystals are suppression of convection in a melt during crystal growth by limiting the thickness of the plate and sufficient area for substrate use.
机译:我们已经通过行进液相线区(TLZ)方法成功地生长了平板状In_(0.3)Ga_(0.7)As单晶,用于衬底。我们发明的用于生长均匀混合晶体的TLZ方法要求扩散受限的质量传递,应避免在熔体中对流。在这一点上,由于对流,难以生长用于基板的大直径晶体。因此,我们试图生长板状的In_(0.3)Ga_(0.7)As晶体。板状晶体的优点是通过限制板的厚度和足够的基板面积来抑制晶体生长过程中熔体中的对流。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号