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ANALYSIS OF THE LINEAR KINK EFFECT IN PARTIALLY DEPLETED SOI NMOSFET'S

机译:部分耗尽型SOI NMOSFET的线性扭结效应分析

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摘要

In this work, the occurrence of the linear kink effect (LKE) in PD SOI nMOSFETs is investigated experimentally and by two-dimensional simulations. The experimental dependence of the LKE on the drain voltage and the channel length is reported, showing a reduction of the second peak in the transconductance when the transistor channel length decrease. By two-dimensional numerical simulations, the impact of various parameters on this second peak has been studied, namely, the gate current level, the carrier lifetime, the increase of the body potential and the threshold voltage variation.
机译:在这项工作中,通过二维仿真实验研究了PD SOI nMOSFET中线性扭结效应(LKE)的发生。报告了LKE对漏极电压和沟道长度的实验依赖性,表明当晶体管沟道长度减小时,跨导的第二个峰值减小。通过二维数值模拟,研究了各种参数对该第二峰的影响,即栅极电流水平,载流子寿命,体电位的增加和阈值电压变化。

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