Simplified Simulator for Neutron-Induced Soft Errors Based on Modified BGR Model

机译：基于修正的BGR模型的中子感应软误差简化模拟器

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Recently the importance of cosmic ray neutron-induced soft errors has been recognized. We proposed a simple model for neutron-induced soft error rates, which is a modified version of the BGR model and developed a simulator, MBGR. MBGR can easily and quickly estimate neutron-induced soft error rates with high accuracy.

机译：最近，人们已经认识到宇宙射线中子引起的软误差的重要性。我们为中子引起的软错误率提出了一个简单的模型，该模型是BGR模型的修改版，并开发了MBGR仿真器。 MBGR可以轻松，快速地以高精度估算中子引起的软错误率。

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来源
《Simulation of semiconductor processes and devices 1998(SISPAD98)》|1998年|117-120|共4页
会议地点 Leuven(BE);Leuven(BE)
作者
Y. Tosaka; H. Kanata; T. Itakura; K.Suzuki; S. Satoh;
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作者单位

Fujitsu Laboratories Ltd. 10-1 Morinosato-Wakamiya, Atsugi 243-0197, Japan;

Fujitsu Laboratories Ltd. 10-1 Morinosato-Wakamiya, Atsugi 243-0197, Japan;

Fujitsu Laboratories Ltd. 10-1 Morinosato-Wakamiya, Atsugi 243-0197, Japan;

Fujitsu Laboratories Ltd. 10-1 Morinosato-Wakamiya, Atsugi 243-0197, Japan;

Fujitsu Laboratories Ltd. 10-1 Morinosato-Wakamiya, Atsugi 243-0197, Japan;

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正文语种 eng
中图分类半导体器件制造工艺及设备;
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专利

1. Simple method for estimating neutron-induced soft error rates based on modified BGR model [J] . Tosaka Y., Kanata H. IEEE Electron Device Letters . 1999,第2期

机译：基于改进的BGR模型的中子诱发软错误率估算简单方法
2. Nuclear Reaction Models Responsible for Simulation of Neutron-induced Soft Errors in Microelectronics [J] . Y. Watanabe, S. Abe Nuclear Data Sheets . 2014,第juna期

机译：负责模拟中子微电子中的软错误的核反应模型
3. Simulation technologies for cosmic ray neutron-induced soft errors: Models and simulation systems [J] . Tosaka Y., Kanata H. IEEE Transactions on Nuclear Science . 1999,第3期

机译：宇宙射线中子引起的软错误的仿真技术：模型和仿真系统
4. Simplified Simulator for Neutron-Induced Soft Errors Based on Modified BGR Model [C] . Y. Tosaka, H. Kanata, T. Itakura, International conference on simulation of semiconductor devices and processes . 1998

机译：基于改进BGR模型的中子诱导的软误差简化模拟器
5. Reliability of SRAM and three-dimensional TSV ICs: Design protection from soft errors and three-dimensional thermal modeling [D] . Shiyanovskii, Yuriy 2012

机译：SRAM和三维TSV IC的可靠性：针对软错误和三维热建模的设计保护
6. SInC: an accurate and fast error-model based simulator for SNPs Indels and CNVs coupled with a read generator for short-read sequence data [O] . Swetansu Pattnaik, Saurabh Gupta, Arjun A Rao, 2014

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7. Aging and voltage scaling impacts under neutron-induced soft error rate in SRAM-based FPGAs [O] . Lima Kastensmidt, Fernanda, Tonfat, Jorge, Both, Thiago, 2014

机译：基于SRAM的FPGA中子引起的软错误率下的老化和电压缩放影响
8. Fixed-Base-Simulator Study of Ability of Pilots to Perform Soft Lunar Landings by Using a Simplified Guidance Technique [R] . Fletcher, H. S., Miller, G. K. 1965

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Simplified Simulator for Neutron-Induced Soft Errors Based on Modified BGR Model

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