首页> 外文会议>Symposium on Ion Beam Synthesis and Processing of Advanced Materials held Nov 27-29, 2000, Boston, Massachusetts, U.S.A. >Post Implantation Treatment of Silicon Carbide-Based Sensors for Hydrogen Detection Properties Enhancement
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Post Implantation Treatment of Silicon Carbide-Based Sensors for Hydrogen Detection Properties Enhancement

机译:碳化硅基传感器的植入后处理,可增强氢的检测性能

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Palladium ion implantation was performed at energies of 35 keV, 50 keV and 100 keV, at both room temperature (RT) and 500 ℃, on two identical sets of 6H, n-typc silicon carbide samples. Then, one set of samples was subjected to a post-implantation sputtering process, in order to eliminate the substrate layer damaged by the palladium ions during implantation. Electrical and micro-Raman measurements have been performed on both sets of samples, aiming for a better understanding of the chemical processes that take place in the presence of hydrogen atmosphere in the chemical sensors prepared this way.
机译:在两组相同的6H,n-typc碳化硅样品上,分别在室温(RT)和500℃下以35 keV,50 keV和100 keV的能量进行钯离子注入。然后,对一组样品进行注入后溅射工艺,以消除注入过程中被钯离子损坏的衬底层。两组样品都进行了电和微拉曼测量,目的是更好地了解以这种方式制备的化学传感器中存在氢气氛时发生的化学过程。

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