首页> 外文会议>Symposium on Microcrystalline and Nanocrystalline Semiconductors-1998 held November 30-December 3, 1998, Boston, Massachusetts, U.S.A. >Effect of hydrogen plasma treatments at very high frequency on p-type amorphous and microcrystalline silicon films
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Effect of hydrogen plasma treatments at very high frequency on p-type amorphous and microcrystalline silicon films

机译:高频氢等离子体处理对p型非晶和微晶硅膜的影响

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Very high frequency (100 MHz) hydrogen plasma treatments on a-Si:H deposited by plasma enhanced chemical vapour deposition were studied. Ex-situ optical measurements have shown that etching and chemical transport occur as competing phenomena. The one that prevails is determined by the plasma conditions. In particular, very efficient chemical etching is observed for high H_2 flow rates, while, for low H_2 flow rates, the equilibrium is shifted toward deposition, and a structural modification of the sample is observed. The experimental conditions were stressed in the direction of utilizing chemical transport from the cathode to deposit very thin (7 nm) microcrystalline films with a pure H_2 plasma.
机译:研究了通过等离子体增强化学气相沉积在a-Si:H上进行的超高频率(100 MHz)氢等离子体处理。异位光学测量表明,蚀刻和化学传输是相互竞争的现象。普遍存在的一种取决于血浆条件。特别是,对于高H_2流速观察到非常有效的化学蚀刻,而对于低H_2流速观察时,平衡向沉积方向移动,并观察到样品的结构改性。在利用化学物质从阴极传输以沉积具有纯H_2等离子体的非常薄的(7 nm)微晶膜的方向上,对实验条件施加了压力。

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