首页> 外文会议>Symposium on Optical Microstructural Characterization of Semiconductors held November 29-30, 1999, Boston, Massachusetts, U.S.A. >Viewport influence on optical pyrometry and deposition process in mocvd vertical rotating discreactors
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Viewport influence on optical pyrometry and deposition process in mocvd vertical rotating discreactors

机译:视口对MOCVD垂直旋转不连续反应器中光学高温和沉积过程的影响

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Optical access to the wafer for the in-situ process monitoring and control is a requirement for the advanced MOCVD equipment. Depending on their location and design, viewports can affect the reactor flow dynamics and temperature distribution inside the growth chamber thus ultimately affecting the depositioon process. Furthermore, deposition on the viewport can inflence the accuracy of in-situ measurements.
机译:先进的MOCVD设备要求对晶片进行光学访问以进行原位过程监控。视其位置和设计而定,视口会影响反应堆的流动动力学和生长室内部的温度分布,从而最终影响沉积过程。此外,在视口上的沉积会影响原位测量的准确性。

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