In this work we show that scanning probe electrostatic force microscopy (EFM) can be applied to low dimensional electronic nanostructures for imaging the density of states of quantum confined carriers. The results on EFM studies are presented for quasi-one-dimensional (1D) Bi quantum wire arrays and quasi-two-dimensional (2D) GaAs/Al_xGa_(1-x)As multiple quantum well structures.
展开▼
