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Surface melt dynamics and super lateral growth regime in long pulse duration excimer laser crystallization of amorphous Si films

机译:非晶硅膜的长脉冲准分子激光结晶中的表面熔体动力学和超横向生长机制

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In this work, the excimer laser induced crystallization of a-Si films on SiO_2 was investigated, using a long pulse duration (200 ns) XeCl source. The microstructural analysis of the laser irradiated area, for incident energy densities comprised between the surface and full melting thresholds of the a-Si layer, respectively, was performed by scanning electron microscopy. A numerical simulation of the surface melt dynamics was also presented and compared to the experimental observatons. direct c 1999 Elsevier Science S.A. All rights reserved.
机译:在这项工作中,使用长脉冲持续时间(200 ns)的XeCl源研究了准分子激光诱导的SiO_2上a-Si膜的结晶。通过扫描电子显微镜对激光照射区域的微观结构分析,分别针对非晶硅层的表面和完全熔化阈值之间的入射能量密度进行了分析。还提出了表面熔体动力学的数值模拟,并将其与实验观测值进行了比较。直接c 1999 Elsevier Science S.A.保留所有权利。

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