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A study on the crystal growth of select II-VI oxides by Czochralski and Bridgman techniques.

机译：通过Czochralski和Bridgman技术研究精选的II-VI氧化物的晶体生长。

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摘要

The crystal growth of ZnO-TeO2 system was experimented by Czochralski and Bridgman techniques. The series of many runs and experimentations helped optimize the growth process, which was faced by a lot of difficulties. These difficulties include, but are not limited to, the evaporation of TeO 2 material above 700 °C, the formation of more than one phase during the growth, and the lack of a ZnO-TeO2 single crystal to start the growth. It was concluded that the main and most persisting problem is that there is no stable phase, in the system that forms a line component at which the crystal growth should be attempted. However, Zn 2Te3O8 and ZnTeO3 single crystals were grown using Czochralski and Bridgman techniques, respectively. It was possible to study some of their important optical and electrical properties for the first time. The phase diagram of this system was investigated using powder x-ray diffraction and scanning electron microprobe. CrystalDiffract 1.3 for Windows software was used to simulate x-ray patterns to find the percentages of the resulting phases. It was found that the type of forming phases might be affected by the process, whether if it was calcining, melting, or pulling. Moreover, the history of the material plays an important role in determining what phases form. The glass form of ZnO-TeO2 system was studied as well for this research. One important finding is that the cut-off band edge of this glass depends greatly on the thickness of the sample used. Dielectric constants and resistivities of several glasses were determined.; Bridgman technique was used to grow CdTe2O5 single crystals. These crystals are transparent to visible light, and have a mica-like structure. Optical and electrical properties of these crystals, like the dielectric constant and resistivity, of these crystals, were investigated.
机译：用Czochralski和Bridgman技术实验了ZnO-TeO2系统的晶体生长。一系列的运行和实验帮助优化了生长过程，这面临许多困难。这些困难包括但不限于700℃以上的TeO 2材料的蒸发，生长过程中多于一个相的形成以及缺少开始生长的ZnO-TeO2单晶。结论是，主要和最持久的问题是在系统中没有稳定相，该稳定相形成了应尝试晶体生长的线成分。但是，分别使用Czochralski和Bridgman技术生长了Zn 2Te3O8和ZnTeO3单晶。首次研究它们的一些重要的光学和电学性质是可能的。使用粉末X射线衍射和扫描电子探针研究了该系统的相图。用于Windows软件的CrystalDiffract 1.3用于模拟X射线图，以找到所得相的百分比。已发现，无论是煅烧，熔融还是拉制，成型阶段的类型都可能受到该工艺的影响。此外，材料的历史在确定形成什么相方面起着重要作用。 ZnO-TeO2体系的玻璃形式也进行了研究。一个重要发现是，该玻璃的截止带边缘在很大程度上取决于所用样品的厚度。确定了几种玻璃的介电常数和电阻率。 Bridgman技术用于生长CdTe2O5单晶。这些晶体对可见光透明，并具有云母状结构。研究了这些晶体的光学和电学性质，如介电常数和电阻率。

著录项

  • 作者

    Nawash, Jalal Mohammad.;

  • 作者单位

    Washington State University.;

  • 授予单位 Washington State University.;
  • 学科 Engineering Materials Science.
  • 学位 Ph.D.
  • 年度 2006
  • 页码 226 p.
  • 总页数 226
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 工程材料学;
  • 关键词

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