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Reducing measurement uncertainty in a DSP-based mixed-signal test environment.

机译:在基于DSP的混合信号测试环境中降低测量不确定度。

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摘要

FFT-based tests (e.g. gain, distortion, SNR, etc.) from a device-under-test (DUT) exhibit normal distributions when the measurement is repeated many times. Hence, a statistical approach to evaluate the accuracy of these measurements is traditionally applied. The noise in a DSP-based mixed-signal test system severely limits its measurement accuracy. Moreover, in high-speed sampled-channel applications the jitter-induced noise from the DUT and test equipment can severely impede accurate measurements.;An integrated mixed-signal test core was implemented in TSMC's 0.18 mum mixed-signal process. Experimental results obtained from the mixed-signal integrated test core validate the proposed digitizer architecture and post processing technique. Bias errors were successfully removed and measurement variance was improved by a factor of 5.;A new digitizer architecture and post-processing methodology is proposed to increase the measurement accuracy of the DUT and the test equipment. An optimal digitizer design is presented which removes any measurement bias due to noise and greatly improves measurement repeatability. Most importantly, the presented system improves accuracy in the same test time as any conventional test.
机译:被测设备(DUT)进行多次重复测量后,基于FFT的测试(例如增益,失真,SNR等)显示出正态分布。因此,传统上采用统计方法来评估这些测量的准确性。基于DSP的混合信号测试系统中的噪声严重限制了其测量精度。此外,在高速采样通道应用中,来自DUT和测试设备的抖动引起的噪声会严重阻碍精确测量。台积电(TSMC)的0.18微米混合信号工艺中采用了集成的混合信号测试核心。从混合信号集成测试核心获得的实验结果验证了所提出的数字化仪架构和后处理技术。成功消除了偏置误差,并将测量方差提高了5倍;提出了一种新的数字化仪架构和后处理方法,以提高DUT和测试设备的测量精度。提出了一种最佳的数字化仪设计,该设计可以消除由于噪声引起的任何测量偏差,并可以大大提高测量的可重复性。最重要的是,该系统在与任何常规测试相同的测试时间内提高了准确性。

著录项

  • 作者

    Taillefer, Chris.;

  • 作者单位

    McGill University (Canada).;

  • 授予单位 McGill University (Canada).;
  • 学科 Engineering Electronics and Electrical.
  • 学位 M.Eng.
  • 年度 2003
  • 页码 100 p.
  • 总页数 100
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

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