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Characterization of structure and properties of thin film crystals and ferroelectric BiFeO3: A coupled TEM, SPM, and optical probe approach.

机译：薄膜晶体和铁电BiFeO3的结构与性能表征：耦合的TEM，SPM和光学探针方法。

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摘要

Correlating advanced microscopy methods including transmission electron microscopy, scanning probe microscopy, and optical spectroscopy on the same materials and even the same specimens allows complimentary measurements to be obtained, revealing new details about structure-property relationships measured on a nanometer scale. Combining measurements not only corroborates the information obtained from any particular method, but also compensates for deficiencies of any single technique. An array of microscopy techniques including high resolution transmission electron microscopy, scanning probe microscopy, and Raman spectroscopy were applied to address scientific and engineering questions concerning the structure and properties of domain patterns in BiFeO3 ferroelectric thin films and to examine novel TiO2(B) thin films suitable for Li-ion battery applications. In BiFeO3, application of these combined techniques allowed a relationship between epitaxial strain and domain width to be established, two cases of strained films with unique domain structures to be identified, transformation of domain structures from all 109° to mixed to all 71° based on differing film thicknesses of 100 and 200 nm to be observed, and to identify growth-induced defects that control domain structure over very long range, 100 nm or more, compared to many studies. In TiO2(B) films, a combination of advanced microscopy and first principals calculations were applied with Raman spectroscopy to produce a definitive reference for further investigation of the crystallinity, structure, composition, and properties of TiO2(B) materials with Raman spectroscopy. Finally to extend these studies of nanostructures and allow direct measurement of electronic and optical properties, the design, development, and construction of proof-of-concept prototypes of specimen rods for in-situ transmission electron microcopy combining electrical probe, scanning tunneling measurements, and optical excitation and spectroscopy is discussed.
机译：在相同的材料甚至相同的样本上，将相关的先进显微镜方法（包括透射电子显微镜，扫描探针显微镜和光学光谱法）进行关联，即可获得互补的测量结果，从而揭示了有关在纳米尺度上测量的结构－特性关系的新细节。组合测量不仅可以确认从任何特定方法获得的信息，而且可以弥补任何单一技术的不足。包括高分辨率透射电子显微镜，扫描探针显微镜和拉曼光谱在内的一系列显微镜技术被用于解决与BiFeO3铁电薄膜中畴图案的结构和性质有关的科学和工程问题，并研究新型TiO2（B）薄膜适用于锂离子电池应用。在BiFeO3中，这些组合技术的应用允许建立外延应变与畴宽度之间的关系，确定两种情况下具有独特畴结构的应变膜，将畴结构从所有109°转变为混合到所有71°，与许多研究相比，可以观察到100和200 nm的不同膜厚，并识别出生长引起的缺陷，这些缺陷可以在100 nm或更大的非常长的范围内控制畴结构。在TiO2（B）薄膜中，将先进的显微镜技术和第一原理计算相结合，并与拉曼光谱法结合使用，从而为进一步研究TiO2（B）材料的拉曼光谱法的结晶度，结构，组成和性能提供了明确的参考。最后，为了扩展对纳米结构的研究，并允许直接测量电子和光学特性，结合电探针，扫描隧道测量和原位透射电子显微镜的标本棒概念验证原型的设计，开发和构造。讨论了光学激发和光谱学。

著录项

  • 作者

    Jokisaari, Jacob Ragnar.;

  • 作者单位

    University of Michigan.;

  • 授予单位 University of Michigan.;
  • 学科 Materials science.
  • 学位 Ph.D.
  • 年度 2016
  • 页码 144 p.
  • 总页数 144
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

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