首页> 外文学位 >Fundamental investigations of CdTe deposited by MBE for applications in thin-film solar photovoltaics.
【24h】

Fundamental investigations of CdTe deposited by MBE for applications in thin-film solar photovoltaics.

机译:MBE沉积的CdTe在薄膜太阳能光伏中的应用的基础研究。

获取原文
获取原文并翻译 | 示例

摘要

Model CdTe systems --both single-crystalline (sx) and poly-crystalline (px) --are investigated experimentally as a means to understand the role of competing material properties and processing steps in improving the performance of standard thin-film solar cells. Previous device optimization work is reviewed explaining the close space sublimation growth technique and ongoing analysis using scanning transmission electron microscopy. This is followed by motivation for molecular beam epitaxy (MBE) growth studies of CdTe and the results of fundamental material investigations. The results show that (a) the minority carrier lifetimes in hetero-epitaxial layers is limited by surface recombination, (b) source selection and anneals can be tuned to achieve p-type carrier density of 6x1015 cm-3, and (c) counter-intuitively, the increase in p-density is associated with increased mobility in lower crystal quality samples, suggesting the role of anneal. Finally, controlled and re-growth of px-CdTe by MBE studies are discussed with results indicating that shorter lifetimes are directly correlated with the increased surface/interface density.
机译:对CdTe模型系统(单晶(sx)和多晶(px))进行了实验研究,以了解竞争的材料特性和加工步骤在提高标准薄膜太阳能电池性能中的作用。回顾了先前的设备优化工作,解释了近空间升华生长技术以及使用扫描透射电子显微镜进行的分析。其次是对CdTe进行分子束外延(MBE)生长研究的动机以及基础材料研究的结果。结果表明:(a)异质外延层中的少数载流子寿命受到表面重组的限制;(b)可以选择源和退火,以实现6x1015 cm-3的p型载流子密度;以及(c)计数器直观上讲,p密度的增加与较低晶体质量样品中迁移率的增加有关,这表明了退火的作用。最后,讨论了通过MBE研究控制和重新生长px-CdTe的结果,结果表明较短的寿命与增加的表面/界面密度直接相关。

著录项

  • 作者

    Colegrove, Eric.;

  • 作者单位

    University of Illinois at Chicago.;

  • 授予单位 University of Illinois at Chicago.;
  • 学科 Physics Condensed Matter.;Alternative Energy.
  • 学位 Ph.D.
  • 年度 2014
  • 页码 157 p.
  • 总页数 157
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 遥感技术;
  • 关键词

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号