首页> 中文期刊> 《北京信息科技大学学报(自然科学版)》 >用广义逆法解决摄影测量系统的非线性问题

用广义逆法解决摄影测量系统的非线性问题

         

摘要

为了提高双CCD摄影测量系统对大口径且具有反射表面物体的近场三维测量精度,提出用最小二乘广义逆法解决成像系统的非线性问题,分析比较了用最小二乘广义逆法和Levenberg-Marquart2种方法解决成像系统的非线性问题,并采用投影生成特征点法,对圆抛物面形卫星天线进行测量,重构其面形。实验表明,该系统操作简单、实用性强,消除系统的非线性问题后,测量精度提高20%,测得面形与理论面形相当吻合,可用于大型物体的面形测量。针对被测物具体条件,选择合适的算法消除系统的非线性问题及合适的光照条件有助于提高系统性能及其实用性。%In order to reduce the mean error of double-CCD closedphotogrammetric system used in measuring large caliber object with reflective surface , the architecture and principle of a visual measurement system based on photogrammetry are described——the method of general reversion of least square. The method of general reversion of least square and that of Levenberg-Maraquart are compared in solving nonlinear system problem,and the former is used to compensate the aberrance of lens . The projected spots is presented as latent spots. An antenna which is paraboloid is measured and reconstructed.Experimental result shows that the system can meet the need of the 3-D measurement of large object. After the aberrance of lens is compensated,the mean error is deduced to 80%.In the light of actural project measured,a suitable method which can solve the nonliear problem under proper light circumstances will help to enhance the system function and practicality.

著录项

相似文献

  • 中文文献
  • 外文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号