A method of using double‐slit interference to measure the refraction index of dielectric film was proposed .Fixing the dielectric film on the double slit ,the refractive index of the dielectric film was determined by measuring the displacement of the white interference stripe in the micrometer eyepiece .T his method had the advantages of obvious phenomenon and easy operation .%利用白光双缝干涉测定介质膜折射率，在双缝前加装待测介质薄膜，通过测微目镜中零级白色条纹在加装前后的位移，测定待测介质薄膜的折射率。此方法有现象明显、操作简便的优点。
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