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Modified wavelength scanning interferometry for simultaneous tomography and topography of the cornea with Fourier domain optical coherence tomography

机译:傅里叶域光学相干层析成像技术的改进的波长扫描干涉仪用于同时进行角膜层析成像和角膜地形图

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摘要

Visual acuity is dependent on corneal shape and size. A minor variation in surface geometry can cause a deformation of corneal geometry, which affects its optical performance. In this work we demonstrate an algorithm for the simultaneous measurement of corneal tomography and topography with a traditional point-scanning Fourier domain optical coherence tomography (FD-OCT) system. A modified wavelength scanning interferometry (mWSI) algorithm enabled topographical evaluation of the surface with nanometer-scale resolution, which is superior to the micrometer-scale resolution of traditional OCT structural imaging. We validated the technique with an optically flat mirror, standard roughness gauges, and atomic force microscopy (AFM). The mirror results show nanometer-scale sensitivity (~3.5 nm), and the mWSI measurements were in good agreement (error ~5%) with the specifications of the roughness comparator and AFM, demonstrating the accuracy of the technique. Following validation, the measurements were made on pig corneas in situ at various artificially controlled intraocular pressures (IOP) and before and after cross-linking (CXL). The results show that the mean surface roughness increased by ~65% after removal of the epithelium in preparation for CXL but did not change as a function of IOP. The demonstrated method could be used for simultaneous measurement of tissue tomography with micrometer-precision and topography with nanometer-precision.
机译:视敏度取决于角膜的形状和大小。表面几何形状的微小变化会导致角膜几何形状的变形,从而影响其光学性能。在这项工作中,我们演示了使用传统的点扫描傅立叶域光学相干层析成像(FD-OCT)系统同时测量角膜层析成像和地形的算法。改进的波长扫描干涉术(mWSI)算法可以纳米级分辨率对表面进行地形评估,这优于传统OCT结构成像的微米级分辨率。我们使用光学平面镜,标准粗糙度仪和原子力显微镜(AFM)验证了该技术。镜面结果显示出纳米级灵敏度(〜3.5 nm),并且mWSI测量与粗糙度比较器和AFM的规格吻合良好(误差约为5%),证明了该技术的准确性。验证后,在各种人工控制的眼内压(IOP)以及交联前后(CXL)对猪角膜进行原位测量。结果表明,在准备CXL去除上皮后,平均表面粗糙度增加了〜65%,但没有随IOP的变化而变化。所证明的方法可用于同时测量具有微米级精度的组织断层摄影术和具有纳米级精度的地形图。

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