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Fully Transparent p-MoTe_2 2D Transistors Using Ultrathin MoO_x/Pt Contact Media for Indium-Tin-Oxide Source/Drain

机译:使用超薄MoO_x / Pt接触介质的铟锡氧化物源极/漏极完全透明的p-MoTe_2 2D晶体管

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摘要

Since transition metal dichalcogenide (TMD) semiconductors are found as 2D van der Waals materials with a discrete energy bandgap, many 2D-like thin field effect transistors (FETs) and PN diodes are reported as prototype electrical and optoelectronic devices. As a potential application of display electronics, transparent 2D FET devices are also reported recently. Such transparent 2D FETs are very few in report, yet no p-type channel 2D-like FETs are seen. Here, 2D-like thin transparent p-channel MoTe2 FETs with oxygen (O-2) plasma-induced MoOx/Pt/indium-tin-oxide (ITO) contact are reported for the first time. For source/drain contact, 60 s short O-2 plasma and ultrathin Pt-deposition processes on MoTe2 surface are sequentially introduced before ITO thin film deposition and patterning. As a result, almost transparent 2D FETs are obtained with a decent mobility of approximate to 5 cm(2) V-1 s(-1), a high ON/OFF current ratio of approximate to 10(5), and 70% transmittance. In particular, for normal MoTe2 FETs without ITO, O-2 plasma process greatly improves the hole injection efficiency and device mobility (approximate to 60 cm(2) V-1 s(-1)), introducing ultrathin MoOx between Pt source/drain and MoTe2. As a final device application, a photovoltaic current modulator, where the transparent FET stably operates as gated by photovoltaic effects, is integrated.
机译:由于人们发现过渡金属二硫化氢(TMD)半导体是具有离散能带隙的2D van der Waals材料,因此许多类似2D的薄场效应晶体管(FET)和PN二极管被报道为电气和光电设备的原型。作为显示电子设备的潜在应用,最近还报道了透明2D FET器件。这样的透明2D FET在报告中很少,但是没有看到类似p型沟道2D的FET。在这里,首次报道了具有氧(O-2)等离子体诱导的MoOx / Pt /铟锡氧化物(ITO)接触的二维类薄透明p沟道MoTe2 FET。对于源极/漏极接触,在ITO薄膜沉积和图案化之前,先在MoTe2表面引入60 s短的O-2等离子体和超薄Pt沉积工艺。结果,获得了几乎透明的2D FET,其迁移率约为5 cm(2)V-1 s(-1),通/断电流比高,约为10(5),透射率约为70% 。特别是,对于没有ITO的普通MoTe2 FET,O-2等离子体工艺极大地提高了空穴注入效率和器件迁移率(约60 cm(2)V-1 s(-1)),在Pt源极/漏极之间引入了超薄MoOx和MoTe2。作为最终的设备应用,集成了光伏电流调制器,其中透明FET在光伏效应的作用下稳定工作。

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  • 来源
    《Advanced Functional Materials》 |2018年第39期|1801204.1-1801204.9|共9页
  • 作者单位

    Yonsei Univ, Inst Phys & Appl Phys, Van der Waals Mat Res Ctr, 50 Yonsei Ro, Seoul 03722, South Korea;

    Yonsei Univ, Inst Phys & Appl Phys, Van der Waals Mat Res Ctr, 50 Yonsei Ro, Seoul 03722, South Korea;

    Yonsei Univ, Inst Phys & Appl Phys, Van der Waals Mat Res Ctr, 50 Yonsei Ro, Seoul 03722, South Korea;

    Yonsei Univ, Inst Phys & Appl Phys, Van der Waals Mat Res Ctr, 50 Yonsei Ro, Seoul 03722, South Korea;

    Yonsei Univ, Inst Phys & Appl Phys, Van der Waals Mat Res Ctr, 50 Yonsei Ro, Seoul 03722, South Korea;

    Yonsei Univ, Sch Elect & Elect Engn, 50 Yonsei Ro, Seoul 03722, South Korea;

    Yonsei Univ, Sch Elect & Elect Engn, 50 Yonsei Ro, Seoul 03722, South Korea;

    Yonsei Univ, Inst Phys & Appl Phys, Van der Waals Mat Res Ctr, 50 Yonsei Ro, Seoul 03722, South Korea;

    Yonsei Univ, Inst Phys & Appl Phys, Van der Waals Mat Res Ctr, 50 Yonsei Ro, Seoul 03722, South Korea;

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  • 正文语种 eng
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  • 关键词

    contact resistance; hole injection layers; MoTe2; plasma-induced MoOx; transparent electronics;

    机译:接触电阻;空穴注入层;MoTe2;等离子体诱导的MoOx;透明电子学;

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