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Electrical Scanning Probe Microscopy On Active Organic Electronic Devices

机译：有源有机电子设备上的电子扫描探针显微镜

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摘要

Polymer- and small-molecule-based organic electronic devices are being developed for applications including electroluminescent displays, transistors, and solar cells due to the promise of low-cost manufacturing. It has become clear that these materials exhibit nanoscale heterogeneities in their optical and electrical properties that affect device performance, and that this nanoscale structure varies as a function of film processing and device-fabrication conditions. Thus, there is a need for high-resolution measurements that directly correlate both electronic and optical properties with local film structure in organic semiconductor films. In this article, we highlight the use of electrical scanning probe microscopy techniques, such as conductive atomic force microscopy (c-AFM), electrostatic force microscopy (EFM), scanning Kelvin probe microscopy (SKPM), and similar variants to elucidate charge injection/extraction, transport, trapping, and generation/recombination in organic devices. We discuss the use of these tools to probe device structures ranging from light-emitting diodes (LEDs) and thin-film transistors (TFT), to light-emitting electrochemical cells (LECs) and organic photovol-taics.
机译：由于低成本制造的希望，正在开发基于聚合物和小分子的有机电子设备，以用于包括电致发光显示器，晶体管和太阳能电池的应用。显而易见的是，这些材料在其光学和电学性质上会表现出纳米级异质性，从而影响器件性能，并且该纳米级结构会随着薄膜加工和器件制造条件的变化而变化。因此，需要将电子和光学性质与有机半导体膜中的局部膜结构直接相关的高分辨率测量。在本文中，我们重点介绍了电扫描探针显微镜技术的使用，例如导电原子力显微镜（c-AFM），静电力显微镜（EFM），扫描开尔文探针显微镜（SKPM）以及用于阐明电荷注入/有机设备中的提取，运输，捕获和生成/重组。我们讨论了如何使用这些工具来探测从发光二极管（LED）和薄膜晶体管（TFT）到发光电化学电池（LEC）和有机光电器件的器件结构。

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