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Micro-statistical modeling of an imperfect interface in a piezoelectric bimaterial under inplane static deformations

机译:面内静态变形下压电双材料中不完美界面的微观统计建模

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摘要

A micro-statistical model is proposed for investigating the effective properties of a micro-damaged interface between a piezoelectric layer and a piezoelectric half-space under in-plane electroelastostatic deformations. The interface is modeled as damaged by periodic arrays of micro-cracks. The lengths and the positions of the micro-cracks on a period interval of the interface are randomly generated. The conditions on the interracial micro-cracks are formulated in terms of hypersingular integro-differential equations with the displacement and electrical potential jumps across the interface being unknown functions to be determined. To gain new useful physical insights into the behaviors of the imperfect interface, the influences of the material constants, the width of the layer and the crack densities of the interface on the effective properties of the interface are examined in details.
机译:提出了一种微统计模型,以研究平面内电弹性变形作用下压电层与压电半空间之间微损伤界面的有效特性。该界面被建模为被微裂纹的周期性阵列损坏。在界面的周期间隔上的微裂纹的长度和位置是随机产生的。用超奇异积分微分方程来表示异族微裂纹的条件,其中跨界面的位移和电位跳变是待确定的未知函数。为了获得对不完美界面行为的新的有用的物理见解,详细检查了材料常数,层的宽度和界面的裂纹密度对界面有效性能的影响。

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