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High mobility 4H-SiC (0001) transistors using alkali and alkaline earth interface layers

机译:使用碱金属和碱土金属界面层的高迁移率4H-SiC(0001)晶体管

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摘要

Alkali (Rb and Cs) and alkaline earth (Ca, Sr, and Ba) elements have been investigated as interface passivation materials for metal-oxide-semiconductor field-effect transistors (MOSFETs) on 4H-SiC (0001). While the alkali elements Rb and Cs result in field-effect mobility (μ) values > 25 cm/V·s, the alkaline earth elements Sr and Ba resulted in higher μ values of 40 and 85 cm/V·s, respectively. The Ba-modified MOSFETs show a slight decrease in mobility with heating to 150 °C, as expected when mobility is not interface-trap-limited, but phonon-scattering-limited. With a Ba interface layer, the interface state density 0.25 eV below the conduction band is ∼3 × 10cm eV, lower than that obtained with nitric oxide passivation. Devices show stable threshold voltage under 2 MV/cm gate bias stress at 175 °C, indicating no mobile ions. Secondary-ion mass spectrometry shows that the Sr and Ba stay predominantly at the interface after oxidation anneals.
机译:已经研究了碱(Rb和Cs)和碱土金属(Ca,Sr和Ba)元素作为4H-SiC(0001)上的金属氧化物半导体场效应晶体管(MOSFET)的界面钝化材料。碱金属元素Rb和Cs的场效应迁移率(μ)值> 25 cm / V·s,而碱土金属元素Sr和Ba的较高μ值分别为40和85 cm / V·s。如迁移率不受界面陷阱限制,但受声子散射限制,Ba改性的MOSFET在加热至150 C时,迁移率会略有下降。对于Ba界面层,在导带以下0.25 eV的界面态密度约为3×10cm eV,低于一氧化氮钝化所获得的界面态密度。器件在175 C的2 MV / cm的栅极偏置应力下显示稳定的阈值电压,表明没有移动离子。二次离子质谱表明,Sr和Ba在氧化退火后主要停留在界面上。

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