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首页> 外文期刊>Applied Physics >Effect of target to substrate distance on the material properties of the Y_2SiO_5:Ce~(3+) thin film by pulsed laser deposition
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Effect of target to substrate distance on the material properties of the Y_2SiO_5:Ce~(3+) thin film by pulsed laser deposition

机译：靶距到衬底距离对脉冲激光沉积Y_2SiO_5：Ce〜（3+）薄膜材料性能的影响

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摘要

The effect of the target-substrate distance on the structural, morphological and photoluminescence (PL) properties of the thin film of the Y2SiO5:Ce3+ commercial phosphor studied by the pulsed laser deposition method. The distance between the target and the substrate was in the order of 4.0-6.0cm with a variation of 0.5. X-ray powder diffraction analysis (XRD) shows that the average crystal size is about 37nm. As the substrate distance is increased, a substantial reduction in film thickness observed from the measurement of mass before and after deposition. This attributes to the semicircular diffusion of the plasma plume due to the reduction of particle species flow over the deposition area of the substrate. The main PL emission peak was observed at 438nm, which is attributed to the 5d4f transition in Ce3+ orbitals. The 5d orbital is the first excited state in Ce3+ ion energy levels with two close states of D-2(3/2) and D-2(5/2). The splitting of 5d into suborbital D-2(3/2) and D-2(5/2) is due to the electron transition between orbitals of the trivalent cerium ion and the host material. This is studied using three excitation wavelengths (276, 303 and 356nm) in which all their corresponding emission is in the same region peaked at 438nm. The highest emission occurs with an excitation wavelength of 356nm for all substrate distances. The CIE gives the blue emission band for the emission wavelength of 438nm. The maximum ultraviolet-visible spectrum absorbance was observed at around 356nm. The scanning electron microscope images show that the sizes and the morphology change as the substrate distance changes. The energy-dispersive X-ray spectrometer shows the presence of all the elements of the compound matrix (Y, Si, O and Ce).
机译：通过脉冲激光沉积方法研究了靶-基片距离对Y2SiO5：Ce3 +商业荧光粉薄膜的结构，形态和光致发光（PL）性能的影响。靶和基板之间的距离为4.0-6.0cm，变化为0.5。 X射线粉末衍射分析（XRD）显示平均晶体尺寸为约37nm。随着基板距离的增加，从沉积前后的质量测量中观察到的膜厚度大大降低。这归因于等离子体羽流的半圆形扩散，这是由于在基板的沉积区域上流过的颗粒种类减少了。在438nm处观察到主要的PL发射峰，这归因于Ce3 +轨道中的5d4f跃迁。 5d轨道是Ce3 +离子能级中的第一个激发态，具有两个闭合状态D-2（3/2）和D-2（5/2）。 5d分裂为亚轨道D-2（3/2）和D-2（5/2）是由于三价铈离子与主体材料之间的电子跃迁。这是使用三个激发波长（276、303和356nm）研究的，其中所有它们相应的发射都在同一区域内，峰值为438nm。对于所有基板距离，最高发射发生在356nm的激发波长处。 CIE给出了438nm发射波长的蓝色发射带。在约356nm处观察到最大的紫外-可见光谱吸光度。扫描电子显微镜图像显示，尺寸和形态随着基材距离的变化而变化。能量色散X射线光谱仪显示化合物基质中所有元素（Y，Si，O和Ce）的存在。

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  • 来源
    《Applied Physics》 |2019年第3期|172.1-172.9|共9页
  • 作者

    Haile H. T.; Dejene F. B.;

  • 作者单位

    Univ Free State Dept Phys QwaQwa Campus Private Bag X13 ZA-9866 Phuthaditjhaba South Africa;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
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