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Effect of annealing on the structural and optical properties of (311)B GaAsBi layers

机译:退火对(311)B GaAsBi层的结构和光学性质的影响

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摘要

The influence of post-growth annealing on the microstructure and photoluminescence (PL) of GaAsBi alloys grown on (311)B GaAs is analyzed. Conventional transmission electron microscopy (TEM) performed on as-grown samples evidence the presence of structural defects and a mosaic structure in the GaAsBi layer. A sequence of stacking faults at regions close to the GaAs/GaAsBi interface are observed in high resolution TEM images. After annealing at 473 K during 3 h the mosaic structure disappears, the presence of defects is reduced and the PL peak intensely enhances.
机译:分析了生长后退火对在(311)B GaAs上生长的GaAsBi合金的微观结构和光致发光(PL)的影响。对生长的样品进行的常规透射电子显微镜(TEM)证明GaAsBi层中存在结构缺陷和镶嵌结构。在高分辨率TEM图像中观察到了在靠近GaAs / GaAsBi界面的区域出现的一系列堆叠断层。在473 K退火3小时后,镶嵌结构消失,缺陷的存在减少,PL峰强烈增强。

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  • 来源
    《Applied Surface Science》 |2010年第18期|P.5688-5690|共3页
  • 作者单位

    Departamento de Ciencia de los Materiales e I.M.y Q. I., Facultad de Ciencias, Universidad de Cadiz, 11510 Puerto Real, Cadiz, Spain;

    rnDepartamento de Ciencia de los Materiales e I.M.y Q. I., Facultad de Ciencias, Universidad de Cadiz, 11510 Puerto Real, Cadiz, Spain;

    rnSchool of Physics and Astronomy, University of Nottingham, NG7 2RD Nottingham, United Kingdom;

    rnSchool of Physics and Astronomy, University of Nottingham, NG7 2RD Nottingham, United Kingdom Nottingham Nanotechnology &Nanoscience Centre, University of Nottingham, NG7 2RD Nottingham, United Kingdom;

    rnSchool of Physics and Astronomy, University of Nottingham, NG7 2RD Nottingham, United Kingdom;

    rnSchool of Physics and Astronomy, University of Nottingham, NG7 2RD Nottingham, United Kingdom;

    rnDepartamento de Ciencia de los Materiales e I.M.y Q. I., Facultad de Ciencias, Universidad de Cadiz, 11510 Puerto Real, Cadiz, Spain;

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  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    semiconductor compounds; GaAsBi; transmission electron microscopy; molecular beam epitaxy; photoluminescence;

    机译:半导体化合物砷化镓透射电子显微镜分子束外延光致发光;

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