Structural, Optical Properties And Band Gap Alignments Of Zro_xn_y Thin Films On Si (1 0 0) By Radio Frequency Sputtering At Different Deposition Temperatures

著录项

• 来源
  《Applied Surface Science》 |2008年第17期|p.5439-5444|共6页
• 作者

  L.Q. Zhu; Q. Fang; X.J. Wang; J.P. Zhang; M. Liu; G. He; L.D. Zhang;

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• 作者单位

  Key Laboratory of Materials Physics, Anhui Key Laboratory of Nanomaterials and Nanostructure, Institute of Solid State Physics, Chinese Academy of Sciences, Hefei 230031, People's Republic of China;

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• 收录信息
• 原文格式 PDF
• 正文语种 eng
• 中图分类 应用物理学;
• 关键词

  x-ray photoelectron spectroscopy (xps); sputtering; spectroscopy ellipsometry; band-offset;

  机译：X射线光电子能谱（xps）;溅射;椭圆偏振光谱;带偏移;