X-ray analysis of ZnO nanorods grown by microwave irradiation heating on ZnO films

K. Ogata; K. Koike; S. Sasa; M. Inoue; M. Yano

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X-ray analysis of ZnO nanorods grown by microwave irradiation heating on ZnO films

机译：微波辐射加热ZnO薄膜生长的ZnO纳米棒的X射线分析

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Utilizing microwave irradiation heating, 100-nm-diameter ZnO nanorods were grown from aqueous solution on sputtered ZnO films on glass substrates. Its out-of-plane X-ray diffraction (XRD) measurement indicated that the ZnO nanorods were grown with c-axis orientation, similar with the underlying ZnO films. In the in-plane XRD measurement, intensity of the (1120) diffraction was comparable with that of the (1010) one, suggesting their intensity ratio would contain useful information on nanorods density.

机译：利用微波辐射加热，从水溶液在玻璃基板上溅射的ZnO膜上生长出直径为100 nm的ZnO纳米棒。其面外X射线衍射（XRD）测量表明，ZnO纳米棒以c轴方向生长，与下面的ZnO薄膜相似。在平面XRD测量中，（1120）衍射的强度与（1010）衍射的强度相当，这表明它们的强度比将包含有关纳米棒密度的有用信息。

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来源
《Applied Surface Science》 |2008年第23期|p.7708-7711|共4页
作者
K. Ogata; K. Koike; S. Sasa; M. Inoue; M. Yano;
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作者单位

Nanomaterials Microdevices Research Center, Osaka Institute of Technology, Osaka 535-8585, Japan;

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原文格式 PDF
正文语种 eng
中图分类应用物理学;
关键词
ZnO nanorods; X-ray diffraction;

机译：ZnO纳米棒;X射线衍射;

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X-ray analysis of ZnO nanorods grown by microwave irradiation heating on ZnO films

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