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首页> 外文期刊>Applied Surface Science >Study on the surface chemical properties of UV excimer laser irradiated polyamide by XPS, ToF-SIMS and CFM
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Study on the surface chemical properties of UV excimer laser irradiated polyamide by XPS, ToF-SIMS and CFM

机译：XPS，ToF-SIMS和CFM研究紫外准分子激光辐照聚酰胺的表面化学性质

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摘要

Polyamide (nylon 6) was irradiated by a pulsed ultraviolet (UV) excimer laser with a fluence below its ablation threshold. Chemical modifications on laser treated nylon were studied by X-ray photoelectron spectroscopy (XPS), time-of-flight secondary ion mass spectrometry (Tof-SIMS) and chemical force microscopy (CFM). XPS study provides information about changes in chemical composition and the chemical-state of atom types on the fiber surface. The high sensitivity of TOF-SIMS to the topmost layers was used to detect crosslinking after the laser treatment. Gold-coated AFM tips modified with -COOH terminated self-assembled alkanethiol monolayers (SAMs) were used to measure adhesion forces on the untreated and laser treated samples. XPS results revealed that the irradiated samples have higher oxygen content than prior to laser irradiation. Tof-SIMS analysis illustrated that carbonyl groups in nylon 6 decrease significantly but hydroxyl groups increase after low-fluence laser irradiation. The adhesion force measurements by CFM showed spatial distribution of hydroxyl groups on nylon 6 after the laser treatment. (C) 2002 Published by Elsevier Science B.V. [References: 17]
机译：用脉冲紫外（UV）准分子激光辐照聚酰胺（尼龙6），其能量通量低于其消融阈值。通过X射线光电子能谱（XPS），飞行时间二次离子质谱（Tof-SIMS）和化学力显微镜（CFM）研究了激光处理尼龙上的化学修饰。 XPS研究提供了有关纤维表面化学组成和原子类型的化学状态变化的信息。 TOF-SIMS对最顶层的高敏感度用于检测激光处理后的交联。用-COOH端接的自组装链烷硫醇单分子层（SAMs）修饰的镀金AFM吸头用于测量未处理和激光处理样品上的附着力。 XPS结果表明，被辐照的样品比激光辐照之前具有更高的氧含量。 Tof-SIMS分析表明，低通量激光辐照后，尼龙6中的羰基显着减少，但羟基增加。通过CFM测量的粘附力显示了在激光处理后尼龙6上羟基的空间分布。 （C）2002由Elsevier Science B.V.出版[参考文献：17]

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