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首页> 外文期刊>Chinese journal of aeronautics >Characterization and Microstructure of PLZT RAINBOW Ceramics
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Characterization and Microstructure of PLZT RAINBOW Ceramics

机译：PLZT彩虹陶瓷的表征和微观结构

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摘要

A new type of large-displacement actuating materials called RAINBOW (Reduced and Internally Biased Oxide Wafer) ceramics is fabricated by a chemical reduction of PLZT piezoelectric ceramics. It is found that PLZT is easily reduced and the thickness of reduced layer has a linear relationship with the reduction time. The optimal conditions for producing RAINBOW samples from PLZT are determined to be 950 deg C for 1-1.5 hours. SEM micrograph shows that the RAINBOW ceramics are composed of reduced and unreduced layer obviously. And the reduced layer is transgranularly fractured while the unreduced ceramic is intergranularly fractured. Metallic lead and refractor oxides (PbO, ZrO_2, Zr-TiO_4, etc.) are found in the reduced layer by XRD analyses, however, the crystal structure of PLZT is not found. The analysis of the reduction mechanism is in good accordance with experimental data.
机译：通过对PLZT压电陶瓷进行化学还原，制造了一种新型的大位移驱动材料，称为RAINBOW（还原和内部偏置氧化硅片）陶瓷。发现PLZT易于还原，并且还原层的厚度与还原时间具有线性关系。确定从PLZT生产RAINBOW样品的最佳条件是在950摄氏度下放置1-1.5小时。 SEM显微照片表明，彩虹陶瓷明显由还原层和未还原层组成。还原层在晶界断裂，而未还原陶瓷在晶界断裂。通过XRD分析在还原层中发现了金属铅和耐火氧化物（PbO，ZrO_2，Zr-TiO_4等），但是未发现PLZT的晶体结构。还原机理的分析与实验数据吻合良好。

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