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Advanced electron crystallography through model-based imaging

机译：通过基于模型的成像进行高级电子晶体学

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The increasing need for precise determination of the atomic arrangement of non-periodic structures in materials design and the control of nanostructures explains the growing interest in quantitative transmission electron microscopy. The aim is to extract precise and accurate numbers for unknown structure parameters including atomic positions, chemical concentrations and atomic numbers. For this purpose, statistical parameter estimation theory has been shown to provide reliable results. In this theory, observations are considered purely as data planes, from which structure parameters have to be determined using a parametric model describing the images. As such, the positions of atom columns can be measured with a precision of the order of a few picometres, even though the resolution of the electron microscope is still one or two orders of magnitude larger. Moreover, small differences in average atomic number, which cannot be distinguished visually, can be quantified using high-angle annular dark-field scanning transmission electron microscopy images. In addition, this theory allows one to measure compositional changes at interfaces, to count atoms with single-atom sensitivity, and to reconstruct atomic structures in three dimensions. This feature article brings the reader up to date, summarizing the underlying theory and highlighting some of the recent applications of quantitative model-based transmisson electron microscopy.
机译：在材料设计和纳米结构控制中对精确确定非周期性结构的原子排列的需求不断增长，这说明了对定量透射电子显微镜的兴趣日益浓厚。目的是为未知结构参数（包括原子位置，化学浓度和原子序数）提取精确和准确的数。为此，统计参数估计理论已显示出可提供可靠的结果。在此理论中，观察仅被视为数据平面，必须使用描述图像的参数模型从中确定结构参数。这样，即使电子显微镜的分辨率仍然大一个或两个数量级，原子列的位置也可以几皮米的精度进行测量。此外，可以使用大角度环形暗场扫描透射电子显微镜图像来量化无法从视觉上分辨出的平均原子序数的微小差异。此外，该理论允许人们测量界面处的成分变化，以单原子敏感性对原子进行计数，并在三个维度上重建原子结构。这篇专题文章将带给读者最新的信息，总结了基础理论并重点介绍了基于定量模型的透射电子显微镜的最新应用。

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