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首页> 外文期刊>Plasma and Fusion Research >Creation of Impurity Source inside Plasmas with Various Types of Tracer-Encapsulated Solid Pellet
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Creation of Impurity Source inside Plasmas with Various Types of Tracer-Encapsulated Solid Pellet

机译：用各种类型的示踪剂包裹的固体颗粒在等离子体内部创建杂质源

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A Tracer-Encapsulated Solid Pellet (TESPEL) was developed for promoting an impurity transport study in a magnetically-confined plasma. One of the advantages of the TESPEL is that it can make a three-dimensionally localized impurity source in the plasma. This enables us to inject the tracer impurity inside or in the vicinity of the region of interest. Recently, a new-type TESPEL with a thinner outer shell has been developed in order to achieve a shallower deposition of the tracer impurity. With the TESPEL having the thinner shell, we have achieved about 4 cm shallower deposition of the tracer impurity, compared with the case of the conventional thick-shell type TESPEL with the same outer diameter of about 700 μm. Moreover, for the achievement of the further shallower deposition of the tracer impurity, we also developed the TESPEL with a tracer-impurity-doped thin shell. After the injection of the TESPEL with the tracer-impurity-doped thin shell, the line emissions from the highly-ionized doped impurity are clearly observed with a vacuum ultraviolet spectrometer, which clearly demonstrates its ability to carry the impurity as a new tool.
机译：示踪剂封装的固体颗粒（TESPEL）的开发是为了促进在磁约束等离子体中进行杂质迁移研究。 TESPEL的优点之一是它可以在等离子体中形成三维定位的杂质源。这使我们能够在示踪区域内或附近注入示踪杂质。近来，已经开发了具有更薄外壳的新型TESPEL，以实现示踪杂质的较浅沉积。与具有相同外径约700μm的常规厚壳型TESPEL的情况相比，使用具有更薄壳的TESPEL，我们实现了约4 cm的较浅的痕量杂质沉积。此外，为了实现更浅的示踪杂质沉积，我们还开发了带有掺杂杂质的薄壳TESPEL。用掺杂有示踪剂杂质的薄壳注入TESPEL之后，用真空紫外光谱仪可以清楚地观察到高度电离的掺杂杂质产生的线发射，这清楚地表明了其作为新工具携带杂质的能力。

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