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The effective carrier lifetime measurement in silicon: The conductivity modulation method

机译:硅中有效载流子寿命的测量:电导率调制方法

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Dark, gamma-induced conductivities and conductivity modulation in silicon material will be investigated for the development of carrier lifetime measurement. The present work includes a simple method for finding the carrier lifetime variation from the measured conductivity under dark and gamma irradiation conditions. It will be concluded that an improved material evaluation in the area of semiconductors and nano-materials are expected to improve the efficiency of solar cells and other opto-electronic devices.
机译:为了研究载流子寿命,将研究硅材料中暗,伽马射线诱导的电导率和电导率调制。目前的工作包括一种简单的方法,可以从暗和伽马辐照条件下的电导率中找出载流子的寿命变化。将得出结论,期望在半导体和纳米材料领域进行更好的材料评估,以提高太阳能电池和其他光电器件的效率。

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