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A simple process step for tuning the optical emission and ultraviolet photosensing properties of sol–gel ZnO film

机译：调节溶胶-凝胶ZnO薄膜的光发射和紫外光敏特性的简单工艺步骤

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A simple process step involving controlled cooling action was successfully established for defect control in a sol–gel ZnO film. In this study, a sol–gel process was adapted to form two sets of ZnO films with two different pre-heat treatment temperatures (set A and set B), but with the same post-heat treatment temperatures subjected to three different cooling rates (0.12, 0.25 and 90 °C s?1) for each set in order to control the defect formation. The structural and surface morphological results showed that ZnO films, for both the sets, exhibited a wurtzite structure, whereas the crystallite orientations, FWHM of the (002) peak and the surface roughness, were found to vary with the cooling rate irrespective of the pre-heat treatment temperature. The films showed phenomenal changes in the photoluminescence (PL) and ultraviolet photoconductivity (PC) results. Irrespective of the set type, the rapidly cooled (90 °C s?1) films showed an improved ultraviolet-to-visible PL intensity ratio as compared to others as a result of reduced defect emission in the visible region. The dark and photo current measurement results indicated the existence of higher adsorbed O2 molecules-related trap states and an enhanced UV photoresponse in rapidly cooled films for both the sets, providing strong evidence in support of defect control. X-ray photoelectron spectroscopy results confirmed the presence of larger adsorbed O2 molecules at the strained oxygen vacancy sites in the rapidly cooled films. These results demonstrated that the post-heat treatment cooling rate could be a brilliant and easy pathway to control the defects for tuning the optical emission and ultraviolet photosensing properties of sol–gel ZnO films.
机译：已成功建立了一个涉及受控冷却作用的简单工艺步骤，以控制溶胶-凝胶ZnO膜中的缺陷。在这项研究中，采用溶胶-凝胶工艺形成了两组ZnO膜，它们具有两种不同的预热处理温度（A组和B组），但具有相同的后热处理温度却经受了三种不同的冷却速率（每组0.12、0.25和90°C s ？1 ）以控制缺陷的形成。结构和表面形态学结果表明，两组ZnO薄膜均显示纤锌矿结构，而结晶取向，（002）峰的FWHM和表面粗糙度随冷却速率的变化而变化，而与前者无关。 -热处理温度。薄膜显示出光致发光（PL）和紫外线光电导（PC）结果的显着变化。与固定类型无关，快速冷却的薄膜（90°C s ？1 ）薄膜与其他薄膜相比，紫外可见PL强度比有所提高减少可见区域的缺陷发射。暗电流和光电流测量结果表明，两组快速冷却的薄膜中都存在较高吸附的O 2 分子相关的陷阱态和增强的UV光响应，从而提供了强大的支持缺陷控制的证据。 X射线光电子能谱分析结果证实，在快速冷却的薄膜的应变氧空位处存在较大的O 2 分子吸附。这些结果表明，热处理后的冷却速率可能是控制缺陷以调节溶胶-凝胶ZnO薄膜的光发射和紫外光敏性能的绝妙途径。

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