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Blisters on graphite surface: a scanning microwave microscopy investigation

机译：石墨表面的水泡：扫描微波显微镜研究

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Scanning microwave microscopy (SMM) is based on the interaction between a sample and an electromagnetic evanescent field, in the microwave frequency range. SMM is usually coupled with a scanning probe microscopy (SPM) technique such as in our case, a scanning tunneling microscope (STM). In this way, the STM tip is used to control the distance between the probe and the sample while acting as an antenna for the microwave field. Thanks to the peculiarity of our home-made setup, the SMM is a suitable method to study blisters formed on HOPG surface as consequence of an electrochemical treatment. Our system has a “broad-band” approach that opens the way to perform local microwave spectroscopy over a broad frequency range. Moreover, microwaves have the ability to penetrate into the sample allowing the sub-surface characterization of materials. The application of the SMM to characterize blisters formed on the HOPG surface provides information on the sub-layer structures.
机译：扫描微波显微镜（SMM）是基于样品和电磁衰减场在微波频率范围内的相互作用。 SMM通常与扫描探针显微镜（SPM）技术结合，例如在我们的情况下是扫描隧道显微镜（STM）。这样，STM尖端就可以控制探针和样品之间的距离，同时充当微波场的天线。由于我们自制设备的特殊性，SMM是研究由于电化学处理而在HOPG表面形成的水泡的合适方法。我们的系统采用“宽带”方法，为在较宽的频率范围内执行局部微波光谱开辟了道路。此外，微波具有穿透样品的能力，从而可以对材料进行亚表面表征。应用SMM表征HOPG表面上形成的水泡可提供有关子层结构的信息。

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