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Irradiation Effects of Swift Heavy Ions Detected by Refractive Index Depth Profiling

机译：折射率深度分析检测到SWIFT重离子的辐照效应

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Evolution of depth profiles of the refractive index in Y3Al5O12 (YAG) crystals were studied under 200 MeV 136Xe14+ ion irradiation, since the index can be related with the stress change and/or the defect formation by the irradiation. Using the prism-coupling and the end-surface coupling methods, various waveguide (WG) modes were detected. Then, the index depth profiles were determined by reproducing the observed WG modes. The index changes were observed at three different depth regions; (i) a sharp dip at 13 μm in depth, which is attributed to the nuclear stopping Sn peak, (ii) a plateau near the surface between 0 and 3 μm in depth, which can be ascribed to the electronic stopping Se, since Se has a very broad peak at the surface, and (iii) a broad peak at 6 μm in depth. Since the last peak is ascribed to neither of Se nor Sn peak, it could be attributed to the synergy effect of Se and Sn.
机译：在200meV 136xe14 +离子照射下，研究了Y3Al5O12（YAG）晶体中折射率的深度谱的进化，因为该指数可以与辐射的应力变化和/或缺陷形成有关。 使用棱镜耦合和端面耦合方法，检测各种波导（WG）模式。 然后，通过再现观察到的WG模式来确定索引深度轮廓。 在三个不同的深度区域观察到指数变化; （i）深度为13μm的尖锐倾斜，归因于核止动Sn峰，（ii）深度靠近0至3μm的表面的平台，这可以归因于电子停止SE 表面上具有非常宽的峰值，（iii）深度为6μm的宽峰。 由于最后峰值归因于SE和SN峰，因此它可能归因于SE和SN的协同效应。

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