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首页> 外文期刊>IEEE Journal of Quantum Electronics >Design and Performance of an InGaAs-InP Single-Photon Avalanche Diode Detector
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Design and Performance of an InGaAs-InP Single-Photon Avalanche Diode Detector

机译:InGaAs-InP单光子雪崩二极管检测器的设计和性能

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摘要

This paper describes the design, fabrication, and performance of planar-geometry InGaAs-InP devices which were specifically developed for single-photon detection at a wavelength of 1550 nm. General performance issues such as dark count rate, single-photon detection efficiency, afterpulsing, and jitter are described.
机译:本文介绍了专为1550 nm波长的单光子检测而开发的平面几何InGaAs-InP器件的设计,制造和性能。描述了诸如暗计数率,单光子检测效率,后脉冲和抖动之类的一般性能问题。

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