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Transient analysis of collector current collapse in multifinger HBT's

机译:多指HBT的集电极电流崩溃的瞬态分析

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摘要

The authors report for the first time a time-domain analysis of thermal instability in multifinger heterojunction bipolar transistors (HBT's). This is based on a transient quasi-three-dimensional (3-D) electrothermal model that selfconsistently solves the thermal and electrical equations. This model is designed to evaluate the thermal time constant of GaAs-based power HBT's employing emitter thermal shunt and emitter ballast resistance.
机译:作者首次报告了多指异质结双极晶体管(HBT)的热不稳定性的时域分析。这是基于瞬态准三维(3-D)电热模型,该模型可自洽地求解热和电方程。该模型旨在评估采用发射极热分流和发射极镇流电阻的GaAs基功率HBT的热时间常数。

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