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Influence of Cr concentration on recording characteristics of Co-Cr media

机译:Cr浓度对Co-Cr介质记录特性的影响

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Investigating the optimum Cr concentration for single-layer Co/sub 100-x/Cr/sub x/ media with high storage capabilities, the authors have prepared 300-nm-thick layers with x=11-34 at.% Cr by coevaporation on polyimide substrates. The values of M/sub s/, Delta theta , H/sub k/, and H/sub c/ (perpen) change slowly and continuously with the Cr concentration x. The degree of the perpendicular crystallographic and magnetic orientation increases with Cr content. Recording tests with VHS-type video heads on 3.5-in. flexible disks, protected by a 40-nm-thick sputtered a-C layer, give clear evidence of a change of the recording mode at approximately 22 at.% Cr. Only for higher x is the preferred perpendicular recording signal obtained. Due to the use of ring heads, the D/sub 50/ values show a strong correlation with H/sub k/, whereas no obvious correlation with Delta theta and H/sub c/ (perpen) is found. For Cr concentrations <25 at.%, D/sub 50/ values of more than 90 kfci are obtained.
机译:为了研究具有高存储能力的单层Co / sub 100-x / Cr / sub x /介质的最佳Cr浓度,作者通过在表面上共蒸发制备了300 nm厚的x = 11-34 at。%Cr的层。聚酰亚胺基材。 M / sub s /,δtheta,H / sub k /和H / sub c /(perpen)的值随Cr浓度x的变化缓慢而连续地变化。垂直晶体学和磁取向的程度随Cr含量的增加而增加。使用3.5英寸VHS型视频磁头录制测试。由厚度为40 nm的溅射a-C层保护的软盘清楚地表明在大约22 at。%Cr时记录模式发生了变化。仅对于更高的x,获得了优选的垂直记录信号。由于使用了环形磁头,D / sub 50 /值显示出与H / sub k /的相关性很强,而与Delta theta和H / sub c /的无明显相关性。对于Cr浓度小于25 at。%的情况,D / sub 50 /值大于90 kfci。

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