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首页> 外文期刊>IEEE transactions on nanotechnology >In Situ Nanoscale In-Plane Deformation Studies of Ultrathin Polymeric Films During Tensile Deformation Using Atomic Force Microscopy and Digital Image Correlation Techniques
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In Situ Nanoscale In-Plane Deformation Studies of Ultrathin Polymeric Films During Tensile Deformation Using Atomic Force Microscopy and Digital Image Correlation Techniques

机译：超薄聚合物薄膜在拉伸变形过程中的原位纳米尺度平面内变形研究，使用原子力显微镜和数字图像相关技术

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摘要

The local, nanoscale deformation behavior of ultrathin polyethylene terephthalate (PET) and polyethylene naphthalate (PEN) films used as substrates in magnetic tapes was studied by atomic force microscopy (AFM) and digital image correlation (DIC) techniques. A custom-designed tensile stage was integrated with the AFM to perform uniaxial tension tests on the polymeric films in situ where the film surfaces were imaged simultaneously by AFM. The surface features on the PET and PEN films were used as reference patterns for the DIC processing. To improve the accuracy of the AFM imaging system for the application of the DIC method, a simple, cost-effective experimental procedure was established. Axial and transverse strain fields and Poisson's ratio maps with a spatial resolution of 78.13 nm were constructed via processing the AFM images of unstretched and stretched samples with the DIC software. Results from the AFM studies indicate that the deformation in both PET and PEN is nonuniform at the nanoscale. The nanoscale deformation mechanisms are discussed in conjunction with the structure of the PET and PEN films
机译：通过原子力显微镜（AFM）和数字图像相关（DIC）技术研究了用作磁带基材的超薄聚对苯二甲酸乙二醇酯（PET）和聚萘二甲酸乙二醇酯（PEN）薄膜的局部，纳米级变形行为。定制设计的拉伸平台与AFM集成在一起，以便在原位对聚合物薄膜进行单轴拉伸测试，在此薄膜表面通过AFM同时成像。 PET和PEN膜上的表面特征被用作DIC处理的参考图案。为了提高DIC方法应用的AFM成像系统的准确性，建立了一种简单，经济高效的实验程序。通过使用DIC软件处理未拉伸样品和拉伸样品的AFM图像，构建了轴向和横向应变场以及具有78.13 nm空间分辨率的泊松比图。 AFM研究的结果表明，PET和PEN的变形在纳米尺度上是不均匀的。结合PET和PEN薄膜的结构讨论了纳米级变形机理

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