首页> 外文期刊>IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control >Growth and the microstructural and ferroelectric characterization of oriented BaMgF/sub 4/ thin films

【24h】

Growth and the microstructural and ferroelectric characterization of oriented BaMgF/sub 4/ thin films

机译：取向BaMgF / sub 4 /薄膜的生长及其微结构和铁电特性

获取原文

获取原文并翻译 | 示例

掌桥外文数据库（机构版） >>

开具论文收录证明 >>

文献代查 >>

页面导航

摘要
著录项
相似文献
相关主题

摘要

The growth of ferroelectric BaMgF/sub 4/ thin films on Si

机译：Si上铁电BaMgF / sub 4 /薄膜的生长

著录项

来源
《IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control》 |1991年第6期|P.663-671|共9页
作者
Sinharoy S.; Buhay H.;
展开▼
作者单位

展开▼
收录信息
原文格式 PDF
正文语种 eng
中图分类声学工程;
关键词

相似文献

外文文献
中文文献
专利

1. Quantitative microstructural and texture characterization by X-ray diffraction of polycrystalline ferroelectric thin films [J] . Ricote J., Chateigner D. Journal of Applied Crystallography . 2004,第1期

机译：多晶铁电薄膜的X射线衍射定量组织和结构表征
2. Epitaxial growth of PbZr_0.5ti_0.5O_3 thin films on SrRuO_3/SrTiO_3 substrates using chemical solution Deposition: Microstructural and ferroelectric properties [J] . J. H. Kim, Youngman Kim Journal of Materials Research . 2001,第6期

机译：使用化学溶液在SrRuO_3 / SrTiO_3衬底上外延生长PbZr_0.5ti_0.5O_3薄膜沉积：微观结构和铁电性能
3. Preparation and microstructural characterization of oriented titanosilicate ETS-10 thin films on indium tin oxide surfaces [J] . Sezin Galioglu, Mariam N. Ismail, Juliusz Warzywoda Microporous and mesoporous materials: The offical journal of the International Zeolite Association . 2010,第1a3期

机译：铟锡氧化物表面取向钛硅酸盐ETS-10薄膜的制备及微观结构表征
4. Ferroelectric properties and crystalline structures of BaMgF_4 thin films grown on Pt(111)/SiO_2/Si(100) [C] . Masashi Moriwaki, Koji Aizawa, Eisuke Tokumitsu, Symposium on Polycrystalline Thin Films - Structure, Texture, Properties and Applications III March 31-April 4,1997, San Francisco, California, U.S.A . 1997

机译：在Pt（111）/ SiO_2 / Si（100）上生长的BaMgF_4薄膜的铁电性能和晶体结构
5. Microstructural characterization of the initial stages of growth of yttrium barium copper oxide thin films: A comparison of lattice-matched and non-lattice-matched growth. [D] . Streiffer, Stephen Kelly. 1993

机译：钇钡氧化铜薄膜生长初期阶段的微观结构表征：晶格匹配和非晶格匹配生长的比较。
6. Ultrathin Ferroelectric Films: Growth Characterization Physics and Applications [O] . Ying Wang, Weijin Chen, Biao Wang, 2014

机译：超薄铁电薄膜：生长表征物理和应用
7. The growth of non-c-axis-oriented ferroelectric BLT thin films on silicon using ZnO buffer layer [O] . Coathup, David, Li, Zheng, Zhu, Xiaojing, 2017

机译：使用ZnO缓冲层在硅上生长非c轴取向铁电BLT薄膜
8. Crystallization and Microstructural Control of Ferroelectric Thin-Films and Glass-Ceramics [R] . Haun, M. J. 1998

机译：铁电薄膜和微晶玻璃的晶化和微观结构控制

获取原文

客服邮箱：kefu@zhangqiaokeyan.com

京公网安备：11010802029741号 ICP备案号：京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有

客服微信
服务号