• 主题
高级搜索  >
历史搜索 清空历史
首页> 外文期刊>International Journal of Production Research >The X control chart for monitoring process shifts in mean and variance
【24h】

The X control chart for monitoring process shifts in mean and variance

机译：X控制图，用于监控过程均值和方差的变化

获取原文
获取原文并翻译 | 示例
           
页面导航
  • 摘要
  • 著录项
  • 相似文献
  • 相关主题

摘要

Control charts are widely used in statistical process control (SPC) to monitor the quality of products or production processes. When dealing with a variable (e.g., the diameter of a shaft, the hardness of a component surface), it is necessary to monitor both its mean and variability (Montgomery 2009 [Montgomery, D.C., 2009. Introduction to statistical quality control. New York: John Wiley & Sons.]). This article studies and compares the overall performances of the X chart and the 3-CUSUM chart for this purpose. The latter is a combined scheme incorporating three individual CUSUM charts and is considered as the most effective scheme for detecting mean shift δ_μ and/or standard deviation shift δ_σ in current SPC literature. The results of the performance studies reveal two interesting findings: (1) the best sample size n for an X chart is always n= 1, in other words, the simplest X chart (i.e., the X chart with n= 1) is the most effective X chart for detecting δ_μ and/or δ_σ; (2) the simplest X chart often outperforms the 3-CUSUM chart from an overall viewpoint unless the latter is redesigned by a difficult optimisation procedure. However, even the optimal 3-CUSUM chart is only slightly more effective than the X chart unless the process shift domain is quite small. Since the X chart is very simple to understand, implement and design, it may be more suitable in many SPC applications, in which both the mean and variance of a variable need to be monitored.
机译：控制图广泛用于统计过程控制（SPC）中，以监视产品或生产过程的质量。在处理变量（例如，轴的直径，组件表面的硬度）时，有必要监视其均值和变异性（Montgomery 2009 [Montgomery，DC，2009.统计质量控制简介。纽约：John Wiley＆Sons。]）。本文研究并比较了X图表和3-CUSUM图表的总体性能。后者是结合了三个单独的CUSUM图的组合方案，被认为是检测当前SPC文献中的平均偏移δ_μ和/或标准偏差偏移δ_σ的最有效方案。性能研究的结果揭示了两个有趣的发现：（1）X图表的最佳样本大小n始终为n = 1，换句话说，最简单的X图表（即n = 1的X图表）为用于检测δ_μ和/或δ_σ的最有效X图表； （2）从总体上看，最简单的X图表通常胜过3-CUSUM图表，除非通过困难的优化程序对其进行了重新设计。但是，除非过程转换域非常小，否则即使是最佳3-CUSUM图也仅比X图稍微有效。由于X图表非常易于理解，实现和设计，因此它可能更适合于许多SPC应用程序，在这些应用程序中，变量的均值和方差都需要监视。

著录项

  • 来源
    《International Journal of Production Research》 |2012年第4期|p.893-907|共15页
  • 作者

    Mei Yang; Zhang Wu; Ka Man Lee; Michael B.C. Khoo;

  • 作者单位

    School of Mechanical and Aerospace Engineering, Nanyang Technological University, Singapore 639798, Singapore;

    School of Mechanical and Aerospace Engineering, Nanyang Technological University, Singapore 639798, Singapore;

    School of Mechanical and Aerospace Engineering, Nanyang Technological University, Singapore 639798, Singapore;

    School of Mathematical Sciences, Universiti Sains Malaysia, 11800 Penang, Malaysia;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    quality control; statistical process control; shewhart chart; CUSUM chart;

    机译：质量控制;统计过程控制;休瓦特图;CUSUM图;

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱：kefu@zhangqiaokeyan.com

京公网安备：11010802029741号 ICP备案号：京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有

  • 客服微信

  • 服务号