...
首页> 外文期刊>Japanese journal of applied physics >Nature of yellow luminescence band in GaN grown on Si substrate
【24h】

Nature of yellow luminescence band in GaN grown on Si substrate

机译:Si衬底上生长的GaN中的黄色发光带的性质

获取原文
获取原文并翻译 | 示例
           

摘要

High-optical-quality GaN was grown on a (111 )Si substrate by metal-organic vapor phase epitaxy using an AllnN buffer layer and an indium doped AIN nucleation layer. The photoluminescence spectra at room temperature showed a strong and narrow edge-emission peak and weak defect-related emission bands. We found four spectral peaks in the green and yellow luminescence bands at G_0:514.5 nm (2.410eV), G_1:546.5 nm (2.269 eV), Y_1: 553.5 nm (2.240eV), and Y_0: 584.5nm (2.121 eV), independent of the growth methods/conditions. The results suggest that the emission is associated with an intrinsic defect such as a Ga vacancy.
机译:使用AllnN缓冲层和铟掺杂的AIN成核层,通过金属-有机气相外延在(111)Si衬底上生长高质量的GaN。室温下的光致发光光谱显示出强而窄的边缘发射峰和弱的与缺陷相关的发射带。我们在绿色和黄色发光带中发现了四个光谱峰,分别​​位于G_0:514.5 nm(2.410eV),G_1:546.5 nm(2.269 eV),Y_1:553.5 nm(2.240eV)和Y_0:584.5nm(2.121 eV),与生长方法/条件无关。结果表明该发射与诸如Ga空位的固有缺陷相关。

著录项

  • 来源
    《Japanese journal of applied physics》 |2014年第11s期|11RC02.1-11RC02.5|共5页
  • 作者单位

    Department of Electrical and Electronic Engineering, Aichi Institute of Technology, Toyota, Aichi 470-0392, Japan;

    Department of Electrical and Electronic Engineering, Aichi Institute of Technology, Toyota, Aichi 470-0392, Japan;

    Department of Electrical and Electronic Engineering, Aichi Institute of Technology, Toyota, Aichi 470-0392, Japan;

    Department of Applied Sciences, Korea Maritime and Ocean University, Busan 606-791, Korea;

    Department of Electronics and Akasaki Research Center, Nagoya University, Nagoya 464-8603, Japan;

    Department of Electronics and Akasaki Research Center, Nagoya University, Nagoya 464-8603, Japan;

    Department of Electronics and Akasaki Research Center, Nagoya University, Nagoya 464-8603, Japan;

    Department of Electronics and Akasaki Research Center, Nagoya University, Nagoya 464-8603, Japan;

    Department of Electronics and Akasaki Research Center, Nagoya University, Nagoya 464-8603, Japan;

  • 收录信息
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号