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首页> 外文期刊>Japanese Journal of Applied Physics. Part 2, Letters & Express Letters >20 mΩ, 750 V High-Power AlGaN/GaN Heterostructure Field-Effect Transistors on Si Substrate
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20 mΩ, 750 V High-Power AlGaN/GaN Heterostructure Field-Effect Transistors on Si Substrate

机译:Si衬底上的20mΩ,750 V大功率AlGaN / GaN异质结构场效应晶体管

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摘要

Low on-resistance and high-breakdown-voltage AlGaN/GaN heterostructure field-effect transistors (HFETs) on Si substrate were fabricated. To improve the breakdown voltage of HFET, the total thickness of epitaxial layers was increased and the gate-to-drain spacing was expanded. As a result, the fabricated AlGaN/GaN HFETs with a gate width of 516 mm exhibited a breakdown voltage of 750 V, an on-resistance of 20 mΩ, and a maximum drain current of more than 170 A. The on-resistance-area product (R_(on) x A) was 0.26 Ω·mm~2. This value was approximately 1/30 compared with that of conventional Si metal-oxide-semiconductor field-effect transistors (MOSFETs).
机译:在硅衬底上制造了低导通电阻和高击穿电压的AlGaN / GaN异质结构场效应晶体管(HFET)。为了提高HFET的击穿电压,增加了外延层的总厚度,并扩大了栅极到漏极的间距。结果,制成的栅极宽度为516 mm的AlGaN / GaN HFET的击穿电压为750 V,导通电阻为20mΩ,最大漏极电流超过170A。导通电阻区域积(R_(on)x A)为0.26Ω·mm〜2。与常规的Si金属氧化物半导体场效应晶体管(MOSFET)相比,该值约为1/30。

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