...
首页> 外文期刊>Japanese Journal of Applied Physics. Part 2, Letters >Iodine Solid Source Inductively Coupled Plasma Etching of InP
【24h】

Iodine Solid Source Inductively Coupled Plasma Etching of InP

机译:InP的碘固体源电感耦合等离子体刻蚀

获取原文
获取原文并翻译 | 示例
           

摘要

We have demonstrated vertical and smooth inductively coupled plasma (ICP) dry etching of InP using solid iodine as a gas source at a low process temperature of 90℃. We prepared a solid iodine crystal in the ICP etching chamber as the etching gas source. Iodine gas was supplied from the solid source at a high vapor pressure into the process chamber. Vertical and smooth etching was realized under the condition of low temperature and low power. The typical etching rate was 0.4 μm/min. We believe that solid I_2-ICP etching is a very simple and useful process for InP-based device fabrication with a resist mask.
机译:我们已经证明了在90℃的低工艺温度下使用固态碘作为气源对InP进行垂直和平滑的电感耦合等离子体(ICP)干法蚀刻。我们在ICP蚀刻室内准备了固态碘晶体作为蚀刻气源。从固体源以高蒸气压将碘气供应到处理室中。在低温和低功率的条件下实现了垂直和平滑的蚀刻。典型的蚀刻速率为0.4μm/ min。我们认为,固态I_2-ICP刻蚀是使用抗蚀剂掩模进行基于InP的器件制造的非常简单且有用的工艺。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号