Pinpoint High Spatial Resolution Analysis Technique for Material Surfaces Using FIB

KAWANO Takashi; HAMADA Etsuo; SATO Kaoru

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Pinpoint High Spatial Resolution Analysis Technique for Material Surfaces Using FIB

机译：使用FIB精确定位材料表面的高空间分辨率分析技术

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Focused ion beam (FIB) is a powerful technique for nano-level analysis on local structures of material surfaces, because it allows us to make a sample of the specific point on sample surfaces. In this paper, the results of cross-sectional analysis of steel surfaces using FIB are presented. It is revealed that the promotion in galvannealing reaction on the thiourea treated P-added steel is due to the formation of fine grain structures in surface region caused by a pinning effect of (Mn, Fe)S particles formed during annealing. It is found that initial alloys formed in the galvanizing processes on Si-added steel have partly peculiar shape and phase. It is suggested that these initial alloys prevent the following galvannealing reaction.

机译：聚焦离子束（FIB）是一种用于对材料表面的局部结构进行纳米级分析的强大技术，因为它使我们能够对样品表面上特定点进行采样。本文介绍了使用FIB对钢表面进行横截面分析的结果。揭示了硫脲处理的P-添加钢的镀锌退火反应的促进是由于在退火期间形成的（Mn，Fe）S颗粒的钉扎效应引起的在表面区域中形成细晶粒结构。已经发现，在镀锌过程中在添加硅的钢上形成的初始合金具有部分奇特的形状和相。建议这些初始合金可防止随后的镀锌反应。

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来源
《JFE technical report》 |2007年第9期|p.1-4|共4页
作者
KAWANO Takashi; HAMADA Etsuo; SATO Kaoru;
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作者单位

Analysis & Characterization Res. Dept., Steel Res. Lab., JFE Steel;

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原文格式 PDF
正文语种 eng
中图分类工业技术;钢铁冶炼（黑色金属冶炼）（总论）;
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机译：纳米级空间分辨率的摩擦学和生物材料表面的化学表征。

Pinpoint High Spatial Resolution Analysis Technique for Material Surfaces Using FIB

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